{"title":"NTT技術史料館を訪ねて","authors":"Sari Maekawa","doi":"10.1541/ieejjournal.143.385","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":38512,"journal":{"name":"Journal of the Institute of Electrical Engineers of Japan","volume":" ","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2023-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of the Institute of Electrical Engineers of Japan","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1541/ieejjournal.143.385","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"Engineering","Score":null,"Total":0}