Some classes of easily testable circuits in the Zhegalkin basis

IF 0.3 Q4 MATHEMATICS, APPLIED

Discrete Mathematics and Applications Pub Date : 2023-02-01 DOI:10.1515/dma-2023-0001

Y. Borodina

引用次数: 0

Abstract

Abstract We identify the classes of Boolean functions that may be implemented by easily testable circuits in the Zhegalkin basis for constant type-1 faults on outputs of gates. An upper estimate for the length of a complete fault detection test for three-place functions is obtained.

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在Zhegalkin基中一些容易测试的电路

摘要我们在Zhegalkin基上识别了可由易于测试的电路实现的布尔函数类，用于门输出上的常数1型故障。获得了三个位置函数的完整故障检测测试的长度的上限估计。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Discrete Mathematics and Applications MATHEMATICS, APPLIED-

CiteScore

0.60

自引率

20.00%

发文量

期刊介绍： The aim of this journal is to provide the latest information on the development of discrete mathematics in the former USSR to a world-wide readership. The journal will contain papers from the Russian-language journal Diskretnaya Matematika, the only journal of the Russian Academy of Sciences devoted to this field of mathematics. Discrete Mathematics and Applications will cover various subjects in the fields such as combinatorial analysis, graph theory, functional systems theory, cryptology, coding, probabilistic problems of discrete mathematics, algorithms and their complexity, combinatorial and computational problems of number theory and of algebra.