Path-Integral Calculation of the Second Dielectric and Refractivity Virial Coefficients of Helium, Neon, and Argon.

IF 1.3 4区 工程技术 Q3 INSTRUMENTS & INSTRUMENTATION
Giovanni Garberoglio, Allan H Harvey
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引用次数: 0

Abstract

We present a method to calculate dielectric and refractivity virial coefficients using the path-integral Monte Carlo formulation of quantum statistical mechanics and validate it by comparing our results with equivalent calculations in the literature and with more traditional quantum calculations based on wavefunctions. We use state-of-the-art pair potentials and polarizabilities to calculate the second dielectric and refractivity virial coefficients of helium (both 3He and 4He), neon (both 20Ne and 22Ne), and argon. Our calculations extend to temperatures as low as 1 K for helium, 4 K for neon, and 50 K for argon. We estimate the contributions to the uncertainty of the calculated dielectric virial coefficients for helium and argon, finding that the uncertainty of the pair polarizability is by far the greatest contribution. Agreement with the limited experimental data available is generally good, but our results have smaller uncertainties, especially for helium. Our approach can be generalized in a straightforward manner to higher-order coefficients.

氦、氖和氩的二次介电和折射率维里系数的路径积分计算
我们提出了一种使用量子统计力学的路径积分蒙特卡罗公式计算介电和折射率维里系数的方法,并通过将我们的结果与文献中的等效计算以及基于波函数的更传统的量子计算进行比较来验证它。我们使用最先进的对势和极化率来计算氦(3He和4He)、氖(20Ne和22Ne)和氩的第二介电和折射率维里系数。我们的计算扩展到氦低至1 K,氖低至4 K,氩低至50 K的温度。我们估计了氦和氩的介电维里系数计算不确定性的贡献,发现对极化率的不确定性是迄今为止最大的贡献。与有限的实验数据相一致通常是好的,但我们的结果具有较小的不确定性,尤其是对于氦。我们的方法可以直接推广到高阶系数。
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来源期刊
自引率
33.30%
发文量
10
审稿时长
>12 weeks
期刊介绍: The Journal of Research of the National Institute of Standards and Technology is the flagship publication of the National Institute of Standards and Technology. It has been published under various titles and forms since 1904, with its roots as Scientific Papers issued as the Bulletin of the Bureau of Standards. In 1928, the Scientific Papers were combined with Technologic Papers, which reported results of investigations of material and methods of testing. This new publication was titled the Bureau of Standards Journal of Research. The Journal of Research of NIST reports NIST research and development in metrology and related fields of physical science, engineering, applied mathematics, statistics, biotechnology, information technology.
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