A Review of Failure Analysis and Detection Methods for Buffer Layers in High-Voltage Cables

IF 2.6 4区工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC

IEEE Electrical Insulation Magazine Pub Date : 2023-10-16 DOI:10.1109/MEI.2023.10286140

Yidong Chen;Kai Zhou;Jiamin Kong;Qi Zhao;Yuan Li;Xiaofeng Xu;Pengxian Song

引用次数: 0

Abstract

This article summarizes recent studies on the buffer layer in high-voltage cables, focusing on the white spots phenomenon on the faulted buffer layer.

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高压电缆缓冲层失效分析与检测方法综述

本文综述了近年来对高压电缆缓冲层的研究，重点研究了故障缓冲层上的白点现象。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

IEEE Electrical Insulation Magazine 工程技术-工程：电子与电气

CiteScore

4.60

自引率

3.40%

发文量

121

审稿时长

>12 weeks

期刊介绍： The EI Magazine publishes articles written by authors from industry, research institutes and academia. The articles are more practical in content than the papers published in the Transactions. Usually three articles are published in each issue. The articles deal with dielectric materials, processes and new developments applied to industry products. Also the EI Magazine is used to promote upcoming conferences and solicits papers for the conferences. In addition, reports on past conferences are given in many issues. Book reviews and news items are included. An editorial is written by both the EIC and the President of DEIS in alternate issues. Advertising of insulation products appears in many issues.