Scatter Corrections in X-Ray Computed Tomography: A Physics-Based Analysis.

IF 1.3 4区 工程技术 Q3 INSTRUMENTS & INSTRUMENTATION
Zachary H Levine, Timothy J Blattner, Adele P Peskin, Adam L Pintar
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引用次数: 4

Abstract

Fundamental limits for the calculation of scattering corrections within X-ray computed tomography (CT) are found within the independent atom approximation from an analysis of the cross sections, CT geometry, and the Nyquist sampling theorem, suggesting large reductions in computational time compared to existing methods. By modifying the scatter by less than 1 %, it is possible to treat some of the elastic scattering in the forward direction as inelastic to achieve a smoother elastic scattering distribution. We present an analysis showing that the number of samples required for the smoother distribution can be greatly reduced. We show that fixed forced detection can be used with many fewer points for inelastic scattering, but that for pure elastic scattering, a standard Monte Carlo calculation is preferred. We use smoothing for both elastic and inelastic scattering because the intrinsic angular resolution is much poorer than can be achieved for projective tomography. Representative numerical examples are given.

Abstract Image

Abstract Image

Abstract Image

x射线计算机断层扫描中的散射校正:基于物理的分析。
x射线计算机断层扫描(CT)散射校正计算的基本限制是在独立原子近似中发现的,从截面分析,CT几何形状和奈奎斯特抽样定理,表明与现有方法相比,计算时间大大减少。通过对散射进行小于1%的修正,可以将部分正向弹性散射视为非弹性散射,从而获得更平滑的弹性散射分布。我们提出的分析表明,更平滑的分布所需的样本数量可以大大减少。我们表明,对于非弹性散射,固定强迫检测可以使用更少的点,但对于纯弹性散射,标准蒙特卡罗计算是首选的。我们对弹性和非弹性散射都使用平滑,因为其固有角分辨率比投影层析成像要差得多。给出了具有代表性的数值算例。
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来源期刊
自引率
33.30%
发文量
10
审稿时长
>12 weeks
期刊介绍: The Journal of Research of the National Institute of Standards and Technology is the flagship publication of the National Institute of Standards and Technology. It has been published under various titles and forms since 1904, with its roots as Scientific Papers issued as the Bulletin of the Bureau of Standards. In 1928, the Scientific Papers were combined with Technologic Papers, which reported results of investigations of material and methods of testing. This new publication was titled the Bureau of Standards Journal of Research. The Journal of Research of NIST reports NIST research and development in metrology and related fields of physical science, engineering, applied mathematics, statistics, biotechnology, information technology.
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