{"title":"Adaptation of a High-Accuracy Spectrophotometer for Ultraviolet Work.","authors":"K D Mielenz, R Mavrodineanu, E D Cehelnik","doi":"10.6028/jres.078A041","DOIUrl":null,"url":null,"abstract":"<p><p>A high-accuracy spectrophotometer, originally designed for work at visible wavelengths, was modified to permit measurements in the ultraviolet without degradation of its original performance. This was accomplished by equipping the spectrophotometer with a stable deuterium arc source, a highly efficient averaging sphere with fluorescent wavelength converter, a new grating, and achromatic sample-compartment optics. The modified spectrophotometer will be used for the development of new Standard Reference Materials, as well as for materials research, in the region between 200 and 300 nm.</p>","PeriodicalId":17018,"journal":{"name":"Journal of Research of the National Bureau of Standards. Section A, Physics and Chemistry","volume":"78A 5","pages":"631-635"},"PeriodicalIF":0.0000,"publicationDate":"1974-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6728490/pdf/jres-78A-631.pdf","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Research of the National Bureau of Standards. Section A, Physics and Chemistry","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.6028/jres.078A041","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A high-accuracy spectrophotometer, originally designed for work at visible wavelengths, was modified to permit measurements in the ultraviolet without degradation of its original performance. This was accomplished by equipping the spectrophotometer with a stable deuterium arc source, a highly efficient averaging sphere with fluorescent wavelength converter, a new grating, and achromatic sample-compartment optics. The modified spectrophotometer will be used for the development of new Standard Reference Materials, as well as for materials research, in the region between 200 and 300 nm.