Studies on wheat mutants induced by nitrogen ion beam implantation.

Abstract

As a new resource of mutagens,low-energy ion beam implantation is characterized as limited physiological damages,wide mutation spectrum, and high mutation frequency in comparison with the mutations from other inducing methods. We treated a wheat doubled haploid line Yi4212 with this technique by nitrogen ion and established a mutant population with 60 lines in our lab. The mutant lines were systematically investigated about their -developmental periods,agronomical performances, gliadin contents and microsatellite variations in M4 generation. The results revealed that in addition to extensive changes of the developmental, agronomical and economical traits of the mutants,the moblities in acid-PAGE of 7 omega-gliadin subunits were also showed changes as some gliadins lacked and novel gliadins obtained. Deletion, expansion and contraction of SSR amplification products occured frequently in 25 SSR loci in the mutants. Combined with our results and other reports,the application prospects of those wheat mutants and the mutation mechanism by ion beam implantation are discussed.