Atomic Force microscopy of neuron networks.

Scanning microscopy Pub Date : 1995-09-01
A Cricenti, G De Stasio, R Generosi, P Perfetti, M T Ciotti, D Mercanti
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Abstract

We imaged uncoated neuron networks by an atomic force microscope in the repulsive regime of contact mode. Images of granule cells and their axons have been clearly revealed with details smaller than 20 nm. The good stability of the sample and the mechanical reproducibility of the microscope allowed the imaging of a neuron culture area of several square microns. By combining tens of images, we were able to reconstruct a highly defined neuronal network. Furthermore, the images were very reproducible over repeated scanning acquisition, demonstrating the mechanical and thermal stability of the instrument-sample system.

神经元网络的原子力显微镜。
我们用原子力显微镜在接触模式的排斥状态下对未涂覆的神经元网络进行了成像。颗粒细胞及其轴突的图像清晰显示,细节小于20 nm。样品的良好稳定性和显微镜的机械再现性使神经元培养区域的成像面积达到几平方微米。通过结合数十张图像,我们能够重建一个高度定义的神经网络。此外,通过重复扫描采集,图像具有很高的可重复性,证明了仪器-样品系统的机械和热稳定性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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