Daniel Rothhardt,Thomas Späth,Paul Philip Schmidt,Ralf Metzler,Regina Hoffmann-Vogel
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引用次数: 0
Abstract
To gain a better understanding of the Kelvin probe force microscopy (KPFM) method, it is important to obtain a quantitative understanding of the measured contact potential dierence (CPD) values as a function of tip-sample distance. This will allow a more complete quantitative understanding of the electronic properties and the forces acting on the tip. Here, we chose Pb islands on the Si(111) 7 × 7 surface, metallic islands on a semiconducting surface. Using a Scanning Force Microscope in frequency modulation mode we perform point bias-approach measurements at 120 K on Pb islands. We investigate how the CPD changes as a function of tip-sample distance and how the electrostatic force changes as a function of the applied bias between tip and sample. The measured distance dependence of the CPD not only allows to connect between the point-of-view of atomic resolution KPFM and of averaging effects of the body of the tip but also allows to investigate the shape of charged objects on the surface.
期刊介绍:
Physical Chemistry Chemical Physics (PCCP) is an international journal co-owned by 19 physical chemistry and physics societies from around the world. This journal publishes original, cutting-edge research in physical chemistry, chemical physics and biophysical chemistry. To be suitable for publication in PCCP, articles must include significant innovation and/or insight into physical chemistry; this is the most important criterion that reviewers and Editors will judge against when evaluating submissions.
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