Towards Effective Sampling of SMT Solutions

IF 6 1区 计算机科学 Q1 COMPUTER SCIENCE, SOFTWARE ENGINEERING
IEEE Transactions on Software Engineering Pub Date : 2026-09-01 Epub Date: 2026-06-10 DOI:10.1109/TSE.2026.3702537
Shuangyu Lyu;Chuan Luo;Ruizhi Shi;Wei Wu;Chanjuan Liu;Chunming Hu
{"title":"Towards Effective Sampling of SMT Solutions","authors":"Shuangyu Lyu;Chuan Luo;Ruizhi Shi;Wei Wu;Chanjuan Liu;Chunming Hu","doi":"10.1109/TSE.2026.3702537","DOIUrl":null,"url":null,"abstract":"This work focuses on effectively generating diverse solutions for satisfiability modulo theories (SMT) formulas, targeting the theories of bit-vectors, arrays, and uninterpreted functions, which is a critical task in software and hardware testing. Generating diverse SMT solutions helps uncover faults and detect safety violations during verification and testing. This gives rise to the SMT sampling problem, whose goal is to construct a diverse solution set that achieves comprehensive coverage of the constraint space. While high coverage is crucial for exploring system behaviors, the number of generated solutions should also be kept small in software engineering scenarios. Since each SMT solution typically corresponds to a test case or test input, generating fewer solutions for the same coverage directly reduces testing time and resource consumption, thereby improving testing efficiency. In this work, we introduce <italic>PanSampler</i>, a novel SMT sampler that achieves high coverage with a small number of solutions. <italic>PanSampler</i> incorporates a new diversity-aware SMT algorithm and a post-sampling optimization strategy, which together enhance its practical performance. It iteratively samples solutions, evaluates candidates, and employs local search to refine solutions, ensuring high coverage with a small number of samples. Extensive experiments on practical benchmarks demonstrate that <italic>PanSampler</i> exhibits a significantly stronger capability to reach high target coverage, while requiring fewer solutions than state-of-the-art samplers to achieve the same coverage level. Furthermore, our empirical evaluation on practical subjects, which are collected from real-world software systems, shows that <italic>PanSampler</i> achieves stronger fault detection capability. Moreover, when reaching the same fault detection effectiveness as the competitors, <italic>PanSampler</i> greatly reduces the number of required solutions, thereby improving testing efficiency. Our evaluations also validate the effectiveness of <italic>PanSampler</i>’s core components. <italic>PanSampler</i> represents a significant advancement in SMT sampling for software engineering, contributing to the cost reduction of software testing and hardware verification.","PeriodicalId":13324,"journal":{"name":"IEEE Transactions on Software Engineering","volume":"52 9","pages":"2670-2687"},"PeriodicalIF":6.0000,"publicationDate":"2026-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11557498","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Software Engineering","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/11557498/","RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2026/6/10 0:00:00","PubModel":"Epub","JCR":"Q1","JCRName":"COMPUTER SCIENCE, SOFTWARE ENGINEERING","Score":null,"Total":0}
引用次数: 0

Abstract

This work focuses on effectively generating diverse solutions for satisfiability modulo theories (SMT) formulas, targeting the theories of bit-vectors, arrays, and uninterpreted functions, which is a critical task in software and hardware testing. Generating diverse SMT solutions helps uncover faults and detect safety violations during verification and testing. This gives rise to the SMT sampling problem, whose goal is to construct a diverse solution set that achieves comprehensive coverage of the constraint space. While high coverage is crucial for exploring system behaviors, the number of generated solutions should also be kept small in software engineering scenarios. Since each SMT solution typically corresponds to a test case or test input, generating fewer solutions for the same coverage directly reduces testing time and resource consumption, thereby improving testing efficiency. In this work, we introduce PanSampler, a novel SMT sampler that achieves high coverage with a small number of solutions. PanSampler incorporates a new diversity-aware SMT algorithm and a post-sampling optimization strategy, which together enhance its practical performance. It iteratively samples solutions, evaluates candidates, and employs local search to refine solutions, ensuring high coverage with a small number of samples. Extensive experiments on practical benchmarks demonstrate that PanSampler exhibits a significantly stronger capability to reach high target coverage, while requiring fewer solutions than state-of-the-art samplers to achieve the same coverage level. Furthermore, our empirical evaluation on practical subjects, which are collected from real-world software systems, shows that PanSampler achieves stronger fault detection capability. Moreover, when reaching the same fault detection effectiveness as the competitors, PanSampler greatly reduces the number of required solutions, thereby improving testing efficiency. Our evaluations also validate the effectiveness of PanSampler’s core components. PanSampler represents a significant advancement in SMT sampling for software engineering, contributing to the cost reduction of software testing and hardware verification.
迈向SMT解决方案的有效取样
这项工作的重点是有效地为可满足模理论(SMT)公式生成各种解决方案,针对位向量,数组和未解释函数的理论,这是软件和硬件测试中的关键任务。生成各种SMT解决方案有助于在验证和测试期间发现故障并检测安全违规。这就产生了SMT采样问题,其目标是构建一个多样化的解决方案集,以实现对约束空间的全面覆盖。虽然高覆盖率对于探索系统行为是至关重要的,但是在软件工程场景中,生成的解决方案的数量也应该保持较小。由于每个SMT解决方案通常对应于一个测试用例或测试输入,因此为相同的覆盖率生成更少的解决方案直接减少了测试时间和资源消耗,从而提高了测试效率。在这项工作中,我们介绍了一种新颖的SMT采样器PanSampler,它可以用少量的溶液实现高覆盖率。PanSampler结合了一种新的多样性感知SMT算法和采样后优化策略,共同提高了其实际性能。它迭代地对解决方案进行采样,评估候选者,并使用局部搜索来优化解决方案,确保使用少量样本实现高覆盖率。在实际基准测试中进行的大量实验表明,与最先进的采样器相比,PanSampler在实现高目标覆盖方面表现出更强的能力,同时需要更少的解决方案来实现相同的覆盖水平。此外,我们对实际软件系统的实证评估表明,PanSampler具有更强的故障检测能力。此外,在达到与竞争对手相同的故障检测效率的情况下,PanSampler大大减少了所需的解数,从而提高了测试效率。我们的评估也验证了PanSampler核心组件的有效性。PanSampler代表了软件工程SMT采样的重大进步,有助于降低软件测试和硬件验证的成本。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
IEEE Transactions on Software Engineering
IEEE Transactions on Software Engineering 工程技术-工程:电子与电气
CiteScore
9.70
自引率
10.80%
发文量
724
审稿时长
6 months
期刊介绍: IEEE Transactions on Software Engineering seeks contributions comprising well-defined theoretical results and empirical studies with potential impacts on software construction, analysis, or management. The scope of this Transactions extends from fundamental mechanisms to the development of principles and their application in specific environments. Specific topic areas include: a) Development and maintenance methods and models: Techniques and principles for specifying, designing, and implementing software systems, encompassing notations and process models. b) Assessment methods: Software tests, validation, reliability models, test and diagnosis procedures, software redundancy, design for error control, and measurements and evaluation of process and product aspects. c) Software project management: Productivity factors, cost models, schedule and organizational issues, and standards. d) Tools and environments: Specific tools, integrated tool environments, associated architectures, databases, and parallel and distributed processing issues. e) System issues: Hardware-software trade-offs. f) State-of-the-art surveys: Syntheses and comprehensive reviews of the historical development within specific areas of interest.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信
小红书