Ahmadreza Saboor Yaraghi;Golnaz Gharachorlu;Sakina Fatima;Lionel C. Briand;Ruiyuan Wan;Ruifeng Gao
{"title":"Efficient Black-Box Fault Localization for System-Level Test Code Using Large Language Models","authors":"Ahmadreza Saboor Yaraghi;Golnaz Gharachorlu;Sakina Fatima;Lionel C. Briand;Ruiyuan Wan;Ruifeng Gao","doi":"10.1109/TSE.2026.3707426","DOIUrl":null,"url":null,"abstract":"Fault localization (FL) is a critical step in debugging, which typically relies on repeated executions to pinpoint faulty code regions. However, repeated executions can be impractical in the presence of non-deterministic failures or high execution costs. While recent efforts have leveraged Large Language Models (LLMs) to aid execution-free FL, these have primarily focused on identifying faults in the system-under-test (SUT) rather than in the often complex system-level test code, i.e., the test script for system-level testing. However, the latter is also important, as in practice, many failures are triggered by faulty test code. To overcome these challenges, we introduce a fully static, LLM-driven approach for system-level test code fault localization (TCFL) that does not require executing the test case. Our method uses a single failure execution log to estimate the test’s execution trace through three novel algorithms that identify only code statements likely involved in the failure. This pruned trace, combined with the error message, is used to prompt the LLM to rank potential faulty locations. Our black-box, system-level approach requires no access to the SUT source code and is applicable to complex test scripts that assess full system behavior. We evaluate our technique at the function, block, and line levels using an industrial dataset of faulty Python test cases that were not used in pre-training LLMs. Results show that our best-estimated traces closely match the actual traces, with an F1 score of around 90%. Additionally, pruning the complex system-level test code reduces the LLM’s inference time by up to 34% without any loss in FL performance. Our results further suggest that block-level TCFL offers a practical balance, narrowing the search space while preserving useful context, achieving an 81% hit rate at top-3 (Hit@3). Finally, our TCFL method achieves equal or higher FL accuracy, requiring over 85% less average inference time per test case and 93% fewer tokens than the latest LLM-guided FL method.","PeriodicalId":13324,"journal":{"name":"IEEE Transactions on Software Engineering","volume":"52 10","pages":"2986-3018"},"PeriodicalIF":6.0000,"publicationDate":"2026-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Software Engineering","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/11578348/","RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2026/6/25 0:00:00","PubModel":"Epub","JCR":"Q1","JCRName":"COMPUTER SCIENCE, SOFTWARE ENGINEERING","Score":null,"Total":0}
引用次数: 0
Abstract
Fault localization (FL) is a critical step in debugging, which typically relies on repeated executions to pinpoint faulty code regions. However, repeated executions can be impractical in the presence of non-deterministic failures or high execution costs. While recent efforts have leveraged Large Language Models (LLMs) to aid execution-free FL, these have primarily focused on identifying faults in the system-under-test (SUT) rather than in the often complex system-level test code, i.e., the test script for system-level testing. However, the latter is also important, as in practice, many failures are triggered by faulty test code. To overcome these challenges, we introduce a fully static, LLM-driven approach for system-level test code fault localization (TCFL) that does not require executing the test case. Our method uses a single failure execution log to estimate the test’s execution trace through three novel algorithms that identify only code statements likely involved in the failure. This pruned trace, combined with the error message, is used to prompt the LLM to rank potential faulty locations. Our black-box, system-level approach requires no access to the SUT source code and is applicable to complex test scripts that assess full system behavior. We evaluate our technique at the function, block, and line levels using an industrial dataset of faulty Python test cases that were not used in pre-training LLMs. Results show that our best-estimated traces closely match the actual traces, with an F1 score of around 90%. Additionally, pruning the complex system-level test code reduces the LLM’s inference time by up to 34% without any loss in FL performance. Our results further suggest that block-level TCFL offers a practical balance, narrowing the search space while preserving useful context, achieving an 81% hit rate at top-3 (Hit@3). Finally, our TCFL method achieves equal or higher FL accuracy, requiring over 85% less average inference time per test case and 93% fewer tokens than the latest LLM-guided FL method.
期刊介绍:
IEEE Transactions on Software Engineering seeks contributions comprising well-defined theoretical results and empirical studies with potential impacts on software construction, analysis, or management. The scope of this Transactions extends from fundamental mechanisms to the development of principles and their application in specific environments. Specific topic areas include:
a) Development and maintenance methods and models: Techniques and principles for specifying, designing, and implementing software systems, encompassing notations and process models.
b) Assessment methods: Software tests, validation, reliability models, test and diagnosis procedures, software redundancy, design for error control, and measurements and evaluation of process and product aspects.
c) Software project management: Productivity factors, cost models, schedule and organizational issues, and standards.
d) Tools and environments: Specific tools, integrated tool environments, associated architectures, databases, and parallel and distributed processing issues.
e) System issues: Hardware-software trade-offs.
f) State-of-the-art surveys: Syntheses and comprehensive reviews of the historical development within specific areas of interest.