Nazario Martino, Francesco Panico, Frank Marken, Alberto Vertova, Alessandro Minguzzi
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引用次数: 0
Abstract
Understanding the surface-state dependence of glucose electrooxidation on platinum is essential for advancing non-enzymatic glucose sensing. Mechanistic assignment based on classical cyclic voltammetry (CV) remains ambiguous because CV convolves glucose adsorption-dehydrogenation with the simultaneous formation and removal of Pt-oxygenated species. Here, we investigate glucose electrooxidation on polycrystalline Pt in phosphate buffer solution (pH 7.3) by combining conventional voltammetry with surface interrogation scanning electrochemical microscopy (SI-SECM), which enables quantitative titration of surface-bound oxidizing equivalents. Using the [Ru-(NH3)6]3+/2+ redox couple as a mediator, the Pt substrate was pre-polarized for 30 s at controlled potentials, then switched to open circuit while tip voltammetry generated Ru2+ to titrate oxidising species (PtOxads) formed on the substrate. SI-SECM reveals that titratable PtOxads begins to form at ∼0.61 V vs RHE and increases with the increase of the pre-polarizing potential. Results evidence how, in the 0.61-0.81 V potential range, commonly associated with incipient hydroxide/OH, these oxidizing species are not consumed by glucose. In contrast, at more anodic potentials (≥0.9 V), the PtOxads amount is significantly reduced in the presence of glucose, indicating direct involvement of higher-potential Pt-oxide species in glucose oxidation. These outcomes clarify the potential-dependent reactivity of Pt-oxygenated layers in neutral media and demonstrate SI-SECM as a powerful approach to decoupling and quantifying surface oxidants that cannot be resolved by CV alone.
了解葡萄糖电氧化对铂的表面状态依赖性对于推进非酶葡萄糖传感至关重要。基于经典循环伏安法(CV)的机理分配仍然不明确,因为CV将葡萄糖的吸附-脱氢与pt氧合物质的同时形成和去除进行了卷积。在这里,我们通过结合常规伏安法和表面探测扫描电化学显微镜(SI-SECM)研究了在磷酸盐缓冲溶液(pH 7.3)中葡萄糖在多晶Pt上的电氧化,这使得表面结合氧化当量的定量滴定成为可能。以[Ru-(NH3)6]3+/2+氧化还原偶对作为介质,在控制电位下预极化30 s,然后切换到开路,同时顶端伏安法产生Ru2+来滴定在底物上形成的氧化物质(ptoxad)。SI-SECM显示,可滴定的ptoxad在~ 0.61 V vs RHE时开始形成,并随着预极化电位的增加而增加。结果表明,在0.61-0.81 V电位范围内,通常与初期氢氧化物/OH有关,这些氧化物质不被葡萄糖消耗。相反,在更高的阳极电位(≥0.9 V)下,葡萄糖存在时ptoxad的数量显著减少,这表明高电位的pt -氧化物直接参与了葡萄糖的氧化。这些结果阐明了中性介质中pt氧化层的电位依赖性反应性,并证明了SI-SECM是一种强大的解耦和量化表面氧化剂的方法,这些表面氧化剂不能单独通过CV来解决。