RAPIDviewer: an ImageJ script for visualization and analysis of indexed electron diffraction patterns of cubic materials.

IF 2.8 3区材料科学 Q1 Biochemistry, Genetics and Molecular Biology

Journal of Applied Crystallography Pub Date : 2026-03-28 eCollection Date: 2026-04-01 DOI:10.1107/S1600576726002086

Thomas E Weirich

引用次数: 0

Abstract

RAPIDviewer is a newly developed ImageJ macro script that addresses the limitations of the indexing program RAPID (which enables the indexing of zone-axis electron diffraction patterns from cubic materials) by generating graphical overlays on the experimental patterns, including configurable spot and Kikuchi line drawings. Additional features include orientation sketches, inverse-pole-figure markers and an option for VESTA file export. Examples utilizing selected-area electron diffraction patterns from an austenitic steel, an M₂₃C₆ precipitate and an aluminium alloy illustrate the features of the program.

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RAPIDviewer：一个用于可视化和分析立方材料索引电子衍射图案的ImageJ脚本。

RAPIDviewer是一个新开发的ImageJ宏脚本，通过在实验图案上生成图形覆盖，包括可配置的点和Kikuchi线条图，解决了索引程序RAPID的局限性（该程序可以对立方材料的区轴电子衍射图案进行索引）。其他功能包括方向草图，反杆图形标记和VESTA文件导出选项。利用奥氏体钢、M23C6沉淀和铝合金的选定区域电子衍射图的例子说明了该程序的特点。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Journal of Applied Crystallography 化学-晶体学

CiteScore

10.00

自引率

3.30%

发文量

178

审稿时长

4.7 months

期刊介绍： Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.