Nada Maatallah;Ali Abdelli;Wajih El Hadj Youssef;Lazhar Khriji;Mohsen Machhout
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引用次数: 0
Abstract
The KLEIN lightweight block cipher provides an effective encryption method suitable for IoT devices with limited computational resources, memory, and energy capacity. Despite its efficiency, the compact design of KLEIN is vulnerable to fault injection attacks, which can disrupt encryption and compromise data security. In this study, we propose a comprehensive fault detection and correction framework for KLEIN that combines parity verification, cyclic redundancy checks (CRC), and a Secure Rollback Recovery mechanism with deceptive output. This approach enables real-time fault identification, produces misleading ciphertext to thwart attackers, and restores the system to the last known correct state, ensuring uninterrupted and reliable encryption. The framework was implemented on an FPGA using Vivado 2022 and validated under various fault scenarios. Results show that the design achieves high fault coverage while maintaining efficiency, with only a 1.73% reduction in operating frequency for detection, a 1.13% hardware overhead for fault detection and a 66.28% increase in hardware area for correction. Overall, the proposed solution significantly strengthens KLEIN against fault injection threats, providing a secure and lightweight cryptographic option for resource-constrained IoT applications.
IEEE AccessCOMPUTER SCIENCE, INFORMATION SYSTEMSENGIN-ENGINEERING, ELECTRICAL & ELECTRONIC
CiteScore
9.80
自引率
7.70%
发文量
6673
审稿时长
6 weeks
期刊介绍:
IEEE Access® is a multidisciplinary, open access (OA), applications-oriented, all-electronic archival journal that continuously presents the results of original research or development across all of IEEE''s fields of interest.
IEEE Access will publish articles that are of high interest to readers, original, technically correct, and clearly presented. Supported by author publication charges (APC), its hallmarks are a rapid peer review and publication process with open access to all readers. Unlike IEEE''s traditional Transactions or Journals, reviews are "binary", in that reviewers will either Accept or Reject an article in the form it is submitted in order to achieve rapid turnaround. Especially encouraged are submissions on:
Multidisciplinary topics, or applications-oriented articles and negative results that do not fit within the scope of IEEE''s traditional journals.
Practical articles discussing new experiments or measurement techniques, interesting solutions to engineering.
Development of new or improved fabrication or manufacturing techniques.
Reviews or survey articles of new or evolving fields oriented to assist others in understanding the new area.