{"title":"A lightweight real-time detection transformer model for surface defect detection systems","authors":"Yingqiang Hou, Xindong Zhang","doi":"10.1016/j.ins.2025.122685","DOIUrl":null,"url":null,"abstract":"<div><div>Accurate and efficient detection of surface defects is essential for production and infrastructure monitoring. A lightweight real-time surface defect detector is proposed, the Surface Defect Detection Real-Time DEtection TRansformer (SDD-RTDETR). It builds upon the Real-Time DEtection TRansformer v2 (RT-DETRv2). Key innovations include Re-Parameterized Partial Convolution (RPConv) within the BasicBlock_RPConv, which minimizes computational workload and memory requirements while boosting performance. The model also proposes the Efficient Multi-Scale Attention-based Feature Interaction (EMSAFI) module to strengthen feature extraction capabilities and employs the lightweight fusion architecture LiteScaleNeck to optimize feature fusion. Additionally, the Inner-Minimum Point Distance Intersection over Union (Inner-MPDIoU) loss refines bounding box regression, further improving model performance. The experimental findings reveal that SDD-RTDETR excels across multiple surface defect datasets. In contrast to the benchmark model, this approach improves detection accuracy while decreasing parameters by 34.6 % and computational complexity by 23.0 %, validating its adaptability and generalization ability in surface defect testing. With its lightweight structure and superior capability, SDD-RTDETR provides an effective approach for large-scale, immediate inspection, driving automation in quality control and infrastructure monitoring.</div></div>","PeriodicalId":51063,"journal":{"name":"Information Sciences","volume":"725 ","pages":"Article 122685"},"PeriodicalIF":6.8000,"publicationDate":"2025-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Information Sciences","FirstCategoryId":"94","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0020025525008187","RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"0","JCRName":"COMPUTER SCIENCE, INFORMATION SYSTEMS","Score":null,"Total":0}
引用次数: 0
Abstract
Accurate and efficient detection of surface defects is essential for production and infrastructure monitoring. A lightweight real-time surface defect detector is proposed, the Surface Defect Detection Real-Time DEtection TRansformer (SDD-RTDETR). It builds upon the Real-Time DEtection TRansformer v2 (RT-DETRv2). Key innovations include Re-Parameterized Partial Convolution (RPConv) within the BasicBlock_RPConv, which minimizes computational workload and memory requirements while boosting performance. The model also proposes the Efficient Multi-Scale Attention-based Feature Interaction (EMSAFI) module to strengthen feature extraction capabilities and employs the lightweight fusion architecture LiteScaleNeck to optimize feature fusion. Additionally, the Inner-Minimum Point Distance Intersection over Union (Inner-MPDIoU) loss refines bounding box regression, further improving model performance. The experimental findings reveal that SDD-RTDETR excels across multiple surface defect datasets. In contrast to the benchmark model, this approach improves detection accuracy while decreasing parameters by 34.6 % and computational complexity by 23.0 %, validating its adaptability and generalization ability in surface defect testing. With its lightweight structure and superior capability, SDD-RTDETR provides an effective approach for large-scale, immediate inspection, driving automation in quality control and infrastructure monitoring.
准确有效的表面缺陷检测对于生产和基础设施监控至关重要。提出了一种轻量级的实时表面缺陷检测器——表面缺陷检测实时检测变压器(SDD-RTDETR)。它建立在实时检测变压器v2 (RT-DETRv2)之上。关键的创新包括BasicBlock_RPConv中的重新参数化部分卷积(RPConv),它在提高性能的同时最大限度地减少了计算工作量和内存需求。该模型还提出了高效多尺度基于注意力的特征交互(EMSAFI)模块来增强特征提取能力,并采用轻量级融合架构LiteScaleNeck来优化特征融合。此外,Inner-Minimum Point Distance Intersection over Union (Inner-MPDIoU) loss改进了边界盒回归,进一步提高了模型的性能。实验结果表明,SDD-RTDETR在多种表面缺陷数据集上表现优异。与基准模型相比,该方法的检测精度提高了34.6%,参数减少了23.0%,计算量减少了23.0%,验证了该方法在表面缺陷检测中的适应性和泛化能力。SDD-RTDETR以其轻巧的结构和优越的性能,为大规模、即时的检测提供了有效的途径,推动了质量控制和基础设施监控的自动化。
期刊介绍:
Informatics and Computer Science Intelligent Systems Applications is an esteemed international journal that focuses on publishing original and creative research findings in the field of information sciences. We also feature a limited number of timely tutorial and surveying contributions.
Our journal aims to cater to a diverse audience, including researchers, developers, managers, strategic planners, graduate students, and anyone interested in staying up-to-date with cutting-edge research in information science, knowledge engineering, and intelligent systems. While readers are expected to share a common interest in information science, they come from varying backgrounds such as engineering, mathematics, statistics, physics, computer science, cell biology, molecular biology, management science, cognitive science, neurobiology, behavioral sciences, and biochemistry.