Operando anomalous X-ray powder diffraction interleaved with X-ray absorption spectroscopy using a scanning 2D imaging detector on the XMaS beamline: design, implementation and performance.
IF 2.8 3区 材料科学Q1 Biochemistry, Genetics and Molecular Biology
Dariusz Wardecki, Paul B J Thompson, Kinga Mlekodaj, Mark G Dowsett, Mieke Adriaens, Amy J Knorpp, Catherine Dejoie, Kinga Góra-Marek, Jeroen A van Bokhoven, Mark A Newton, Przemyslaw Rzepka
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引用次数: 0
Abstract
We present a method for achieving high-quality anomalous X-ray powder diffraction, interleaved with transmission X-ray absorption spectroscopy, using a flat-panel imaging detector scanned over a large angular range. Anomalous X-ray powder diffraction is a technique that enables the highlighting of specific elements within a crystal structure and pinpointing the nature of active (or inactive) sites involved in specific reactions in situ or in an operando manner. This approach enables the collection of a Q range that is not attainable using static flat-panel detectors in the absorption energy regimes used (8.94-17.5 keV). We consider the advantages and limitations of such an approach compared with alternative methods and describe in detail how it is achieved, along with the data processing and workflow required for an accurate restoration of conventional X-ray powder diffraction and anomalous X-ray powder diffraction data from sequentially acquired images. We demonstrate the applicability and capacity of this method for the in situ/operando restoration of the positions and atomic arrangement of copper atoms in the elevated-temperature aerobic activation of a copper-ion-exchanged zeolite, Cu-mazzite.
期刊介绍:
Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.