Log-Diameter MST Verification and Sensitivity in MPC

IF 0.7 4区 计算机科学 Q4 COMPUTER SCIENCE, SOFTWARE ENGINEERING
Sam Coy, Artur Czumaj, Gopinath Mishra, Anish Mukherjee
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引用次数: 0

Abstract

We consider two natural variants of the problem of minimum spanning tree (\(\text {MST}\)) of a graph in the parallel setting: MST verification (verifying if a given tree is an \(\text {MST}\)) and the sensitivity analysis of an MST (finding the lowest cost replacement edge for each edge of the \(\text {MST}\)). These two problems have been studied extensively for sequential algorithms and for parallel algorithms in the \(\textrm{PRAM}\) model of computation. In this paper, we extend the study to the standard model of Massive Parallel Computation (\(\textrm{MPC}\)). It is known that for graphs of diameter D, the connectivity problem can be solved in \(O(\log D + \log \log n)\) rounds on an \(\textrm{MPC}\) with low local memory (each machine can store only \(O(n^{\delta })\) words for an arbitrary constant \(\delta > 0\)) and with linear global memory, that is, with optimal utilization. However, for the related task of finding an \(\text {MST}\), we need \(\Omega (\log D_{\text {MST}})\) rounds, where \(D_{\text {MST}}\) denotes the diameter of the minimum spanning tree. The state of the art upper bound for \(\text {MST}\) is \(O(\log n)\) rounds; the result follows by simulating existing \(\textrm{PRAM}\) algorithms. While this bound may be optimal for general graphs, the benchmark of connectivity and lower bound for \(\text {MST}\) suggest the target bound of \(O(\log D_\text {MST})\) rounds, or possibly \(O(\log D_\text {MST} + \log \log n)\) rounds. As for now, we do not know if this bound is achievable for the \(\text {MST}\) problem on an \(\textrm{MPC}\) with low local memory and linear global memory. In this paper, we show that two natural variants of the \(\text {MST}\) problem: \(\text {MST}\) verification and sensitivity analysis of an \(\text {MST}\), can be completed in \(O(\log D_T)\) rounds on an \(\textrm{MPC}\) with low local memory and with linear global memory, that is, with optimal utilization; here \(D_T\) is the diameter of the input “candidate \(\text {MST}\)T. The algorithms asymptotically match our lower bound, conditioned on the 1-vs-2-cycle conjecture.

Abstract Image

测井径MST在MPC中的验证和灵敏度
我们考虑了并行设置中图的最小生成树(\(\text {MST}\))问题的两个自然变体:MST验证(验证给定树是否为\(\text {MST}\))和MST的灵敏度分析(为\(\text {MST}\)的每个边找到成本最低的替换边)。这两个问题在\(\textrm{PRAM}\)计算模型中对顺序算法和并行算法进行了广泛的研究。在本文中,我们将研究扩展到大规模并行计算的标准模型(\(\textrm{MPC}\))。众所周知,对于直径为D的图,连接问题可以在具有低本地内存(每台机器只能为任意常数\(\delta > 0\)存储\(O(n^{\delta })\)个单词)和线性全局内存(即最佳利用率)的\(\textrm{MPC}\)上以\(O(\log D + \log \log n)\)轮的形式解决。然而,对于寻找\(\text {MST}\)的相关任务,我们需要\(\Omega (\log D_{\text {MST}})\)轮数,其中\(D_{\text {MST}}\)表示最小生成树的直径。目前\(\text {MST}\)的上界是\(O(\log n)\)轮;通过对现有\(\textrm{PRAM}\)算法的模拟得到了结果。虽然这个边界对于一般图来说可能是最优的,但是连接性基准和\(\text {MST}\)的下界建议的目标边界是\(O(\log D_\text {MST})\)轮,或者可能是\(O(\log D_\text {MST} + \log \log n)\)轮。到目前为止,我们还不知道在具有低本地内存和线性全局内存的\(\textrm{MPC}\)上的\(\text {MST}\)问题是否可以实现这个界限。在本文中,我们证明了\(\text {MST}\)问题的两个自然变体:\(\text {MST}\)的验证和\(\text {MST}\)的灵敏度分析,可以在具有低局部内存和线性全局内存的\(\textrm{MPC}\)上以\(O(\log D_T)\)轮完成,即具有最佳利用率;这里\(D_T\)是输入“候选\(\text {MST}\)”t的直径,算法渐近地匹配我们的下界,条件是1 vs 2周期猜想。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Algorithmica
Algorithmica 工程技术-计算机:软件工程
CiteScore
2.80
自引率
9.10%
发文量
158
审稿时长
12 months
期刊介绍: Algorithmica is an international journal which publishes theoretical papers on algorithms that address problems arising in practical areas, and experimental papers of general appeal for practical importance or techniques. The development of algorithms is an integral part of computer science. The increasing complexity and scope of computer applications makes the design of efficient algorithms essential. Algorithmica covers algorithms in applied areas such as: VLSI, distributed computing, parallel processing, automated design, robotics, graphics, data base design, software tools, as well as algorithms in fundamental areas such as sorting, searching, data structures, computational geometry, and linear programming. In addition, the journal features two special sections: Application Experience, presenting findings obtained from applications of theoretical results to practical situations, and Problems, offering short papers presenting problems on selected topics of computer science.
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