Aihua Ke , Jian Luo , Yaoxiang Yu , Le Li , Bo Cai
{"title":"An industrial defect detection method based on mixed noise synthesis","authors":"Aihua Ke , Jian Luo , Yaoxiang Yu , Le Li , Bo Cai","doi":"10.1016/j.compind.2025.104388","DOIUrl":null,"url":null,"abstract":"<div><div>Deep learning-based methods have significantly reduced the cost of traditional manual quality inspection while enhancing accuracy and efficiency in industrial defect detection. As a result, these methods have become a prominent research focus in computer vision for intelligent manufacturing. They are increasingly applied in various production and operational contexts, including automated inspection, intelligent monitoring, and quality control. This paper presents a novel method called mixed noise synthesized defect detection, designed to identify multiple types of defects in industrial products. The proposed method employs a generative adversarial network architecture composed of a defect synthesizer, a defect discriminator, a feature extractor, and a multi-scale patch adaptor. By leveraging the feature extractor and multi-scale adaptor, the method effectively captures normal feature distributions and synthesizes realistic defect features through mixed noise synthesis, thereby significantly reducing reliance on labeled data. In addition, the defect discriminator uses a dual evaluation strategy that combines adversarial loss with Kullback–Leibler divergence to assess input features and quantify defect severity. Comprehensive experiments on benchmark anomaly detection datasets demonstrate that the method achieves high performance, with image-level and pixel-level area under the receiver operating characteristic curve scores of 99.8% and 99.4% for texture categories, and 96.7% and 98.3% for object categories, substantially outperforming state-of-the-art methods. The source code is publicly available at <span><span>https://github.com/ah-ke/MNS-Defect.git</span><svg><path></path></svg></span>.</div></div>","PeriodicalId":55219,"journal":{"name":"Computers in Industry","volume":"173 ","pages":"Article 104388"},"PeriodicalIF":9.1000,"publicationDate":"2025-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Computers in Industry","FirstCategoryId":"94","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0166361525001538","RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"COMPUTER SCIENCE, INTERDISCIPLINARY APPLICATIONS","Score":null,"Total":0}
引用次数: 0
Abstract
Deep learning-based methods have significantly reduced the cost of traditional manual quality inspection while enhancing accuracy and efficiency in industrial defect detection. As a result, these methods have become a prominent research focus in computer vision for intelligent manufacturing. They are increasingly applied in various production and operational contexts, including automated inspection, intelligent monitoring, and quality control. This paper presents a novel method called mixed noise synthesized defect detection, designed to identify multiple types of defects in industrial products. The proposed method employs a generative adversarial network architecture composed of a defect synthesizer, a defect discriminator, a feature extractor, and a multi-scale patch adaptor. By leveraging the feature extractor and multi-scale adaptor, the method effectively captures normal feature distributions and synthesizes realistic defect features through mixed noise synthesis, thereby significantly reducing reliance on labeled data. In addition, the defect discriminator uses a dual evaluation strategy that combines adversarial loss with Kullback–Leibler divergence to assess input features and quantify defect severity. Comprehensive experiments on benchmark anomaly detection datasets demonstrate that the method achieves high performance, with image-level and pixel-level area under the receiver operating characteristic curve scores of 99.8% and 99.4% for texture categories, and 96.7% and 98.3% for object categories, substantially outperforming state-of-the-art methods. The source code is publicly available at https://github.com/ah-ke/MNS-Defect.git.
期刊介绍:
The objective of Computers in Industry is to present original, high-quality, application-oriented research papers that:
• Illuminate emerging trends and possibilities in the utilization of Information and Communication Technology in industry;
• Establish connections or integrations across various technology domains within the expansive realm of computer applications for industry;
• Foster connections or integrations across diverse application areas of ICT in industry.