Matej Sebek, Tobias Olaf Buchmann, Peter Uhd Jepsen, Simon Jappe Lange
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引用次数: 0
Abstract
Terahertz (THz) radiation has emerged as a powerful tool for inducing ultrafast electron emission and controlling electron beams, with applications in photonics and electron microscopy. Here, the first realization of on-chip electron emission control using an active THz metasurface is reported. The device integrates resonant dipole antennas and bias arms on a fused silica substrate, enabling precise modulation of electron trajectories through electrostatic control. Experimental results, supported by particle-in-cell simulations, reveal that electron emission via Fowler–Nordheim tunneling can be dynamically steered by varying the applied bias. A positive bias suppresses emission by attracting electrons to the bias arms, while a negative bias repels them, allowing trajectory control and the emergence of new emission features. Time-of-flight measurements show distinct shifts in electron emission behavior, with strong correlation to bias voltage and THz field strength. This work demonstrates a practical approach to integrating ultrafast electron control into chip-scale systems.
期刊介绍:
Advanced Optical Materials, part of the esteemed Advanced portfolio, is a unique materials science journal concentrating on all facets of light-matter interactions. For over a decade, it has been the preferred optical materials journal for significant discoveries in photonics, plasmonics, metamaterials, and more. The Advanced portfolio from Wiley is a collection of globally respected, high-impact journals that disseminate the best science from established and emerging researchers, aiding them in fulfilling their mission and amplifying the reach of their scientific discoveries.