{"title":"AnomNet: A Dual-Stage Centroid Optimization Framework for Unsupervised Anomaly Detection.","authors":"Yuan Gao, Yu Wang, Xiaoguang Tu, Jiaqing Shen","doi":"10.3390/jimaging11090301","DOIUrl":null,"url":null,"abstract":"<p><p>Anomaly detection plays a vital role in ensuring product quality and operational safety across various industrial applications, from manufacturing to infrastructure monitoring. However, current methods often struggle with challenges such as limited generalization to complex multimodal anomalies, poor adaptation to domain-specific patterns, and reduced feature discriminability due to domain gaps between pre-trained models and industrial data. To address these issues, we propose AnomNet, a novel deep anomaly detection framework that integrates a lightweight feature adapter module to bridge domain discrepancies and enhance multi-scale feature discriminability from pre-trained backbones. AnomNet is trained using a dual-stage centroid learning strategy: the first stage employs separation and entropy regularization losses to stabilize and optimize the centroid representation of normal samples; the second stage introduces a centroid-based contrastive learning mechanism to refine decision boundaries by adaptively managing inter- and intra-class feature relationships. The experimental results on the MVTec AD dataset demonstrate the superior performance of AnomNet, achieving a 99.5% image-level AUROC and 98.3% pixel-level AUROC, underscoring its effectiveness and robustness for anomaly detection and localization in industrial environments.</p>","PeriodicalId":37035,"journal":{"name":"Journal of Imaging","volume":"11 9","pages":""},"PeriodicalIF":2.7000,"publicationDate":"2025-09-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12470577/pdf/","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Imaging","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.3390/jimaging11090301","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"IMAGING SCIENCE & PHOTOGRAPHIC TECHNOLOGY","Score":null,"Total":0}
引用次数: 0
Abstract
Anomaly detection plays a vital role in ensuring product quality and operational safety across various industrial applications, from manufacturing to infrastructure monitoring. However, current methods often struggle with challenges such as limited generalization to complex multimodal anomalies, poor adaptation to domain-specific patterns, and reduced feature discriminability due to domain gaps between pre-trained models and industrial data. To address these issues, we propose AnomNet, a novel deep anomaly detection framework that integrates a lightweight feature adapter module to bridge domain discrepancies and enhance multi-scale feature discriminability from pre-trained backbones. AnomNet is trained using a dual-stage centroid learning strategy: the first stage employs separation and entropy regularization losses to stabilize and optimize the centroid representation of normal samples; the second stage introduces a centroid-based contrastive learning mechanism to refine decision boundaries by adaptively managing inter- and intra-class feature relationships. The experimental results on the MVTec AD dataset demonstrate the superior performance of AnomNet, achieving a 99.5% image-level AUROC and 98.3% pixel-level AUROC, underscoring its effectiveness and robustness for anomaly detection and localization in industrial environments.