Cepstral Analysis of Ultrasonic Echoes Measured by an Antenna Array in Order to Obtain Super-Resolution Images of Reflectors

IF 0.9 4区 材料科学 Q4 MATERIALS SCIENCE, CHARACTERIZATION & TESTING
E. G. Bazulin, A. A. Krylovich
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引用次数: 0

Abstract

The digital focusing aperture (DFA) method is widely used to image reflectors during ultrasonic inspection. The reliability of inspection is determined by the quality of the DFA image—resolution and signal-to-noise ratio. To achieve super-resolution of echo signals, which will lead to lateral super-resolution of reflectors, various methods are used: maximum entropy method, Bernoulli–Gaussian deconvolution, Lucy–Richardson deconvolution, methods of recognition with compression (CS), methods of construction of autoregressive models of signals, etc. To apply these methods, we need to know the impulse response of the ultrasonic inspection system. It can be measured, but you can use methods of  “blind” deconvolution, which are used in image and signal processing. For example: the method of eliminating camera blur at its random displacement, maximum correlated kurtosis deconvolution (MCKD), cepstral analysis, etc. In this paper, a cepstral analysis method for super-resolution or for obtaining information about the impulse response of the system is considered to construct an AR spectrum model to obtain the lateral super-resolution of DFA-images. The performance of the proposed method is confirmed by model experiments.

Abstract Image

天线阵列测量超声回波的倒谱分析以获得反射器的超分辨率图像
数字聚焦孔径法(DFA)在超声检测中被广泛应用于反射面成像。检测的可靠性取决于DFA图像分辨率和信噪比的好坏。为了实现回波信号的超分辨率,从而导致反射器的横向超分辨率,采用了各种方法:最大熵法、伯努利-高斯反卷积、露西-理查森反卷积、压缩识别(CS)方法、信号自回归模型构建方法等。为了应用这些方法,我们需要知道超声波检测系统的脉冲响应。它是可以测量的,但你可以使用“盲”反卷积的方法,这是用于图像和信号处理。例如:在随机位移处消除相机模糊的方法、最大相关峰度反褶积(MCKD)、倒谱分析等。本文考虑了一种超分辨率或获取系统脉冲响应信息的倒谱分析方法,构建了AR光谱模型以获得dfa图像的横向超分辨率。模型实验验证了该方法的有效性。
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来源期刊
Russian Journal of Nondestructive Testing
Russian Journal of Nondestructive Testing 工程技术-材料科学:表征与测试
CiteScore
1.60
自引率
44.40%
发文量
59
审稿时长
6-12 weeks
期刊介绍: Russian Journal of Nondestructive Testing, a translation of Defectoskopiya, is a publication of the Russian Academy of Sciences. This publication offers current Russian research on the theory and technology of nondestructive testing of materials and components. It describes laboratory and industrial investigations of devices and instrumentation and provides reviews of new equipment developed for series manufacture. Articles cover all physical methods of nondestructive testing, including magnetic and electrical; ultrasonic; X-ray and Y-ray; capillary; liquid (color luminescence), and radio (for materials of low conductivity).
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