As-Flux-Induced Diameter Control in GaAs Nanowires

IF 3.2 3区 化学 Q2 CHEMISTRY, PHYSICAL
Ziyue Yin, , , Haotian Zeng*, , , Giorgos Boras*, , , Raghavendra R. Juluri, , , Huiwen Deng*, , , Hui Jia, , , Chong Chen, , , Stephen Church, , , Anton Velychko, , , Fahad Alghamdi, , , Jae-Seong Park, , , Mingchu Tang, , , David Mowbray, , , Patrick Parkinson, , , Ana M. Sanchez, , and , Huiyun Liu, 
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Abstract

Controlling the diameter of self-catalyzed III–V nanowires is important for tailoring their performance in optoelectronic applications. Here, we investigate the impact of abrupt or gradual increase of the V/III flux ratio on the GaAs nanowire diameter. A dynamic model of nanowire diameter is developed to explain the changes induced by flux ratio modulation: (i) shrinkage of the catalyst droplet under elevated As flux and (ii) convergence toward a critical diameter governed by the flux ratio during subsequent nanowire elongation. The different diameter behaviors observed under abrupt or gradual flux increase are elucidated by this relationship, through which we present a quantitative analysis of the relationship between the nanowire diameter and the V/III flux ratio. Epitaxial Ge shells were grown around the modulated-diameter GaAs cores to investigate any impact on the morphology and quality of the group-IV shell. The Ge shell is found to maintain a uniform thickness, regardless of the diameter of the GaAs core. High-resolution annular dark-field scanning transmission electron microscopy reveals Ge shell sidewalls indexed to the {112} planes and rotated by 47° relative to the GaAs core facets, while energy-dispersive X-ray spectroscopy confirms slight Ge interdiffusion into the GaAs core. This work provides a predictive framework for controlling the diameter evolution under varying flux ratios and provides insights into III–V/IV heterointegration.

Abstract Image

砷化镓纳米线的as - flux诱导直径控制
控制自催化III-V纳米线的直径对于调整其在光电应用中的性能非常重要。在这里,我们研究了突然或逐渐增加的V/III通量比对GaAs纳米线直径的影响。建立了纳米线直径的动态模型来解释通量比调制引起的变化:(i)催化剂液滴在较高的As通量下收缩,(ii)在随后的纳米线延伸过程中向由通量比控制的临界直径收敛。这一关系解释了纳米线直径与V/III通量比之间的关系,并对纳米线直径与V/III通量比之间的关系进行了定量分析。在调制直径的GaAs核心周围生长外延Ge壳,以研究其对iv族壳的形貌和质量的影响。发现无论GaAs芯的直径如何,Ge壳都保持均匀的厚度。高分辨率环形暗场扫描透射电子显微镜显示Ge壳侧壁指向{112}面,相对于GaAs核心面旋转了47°,而能量色散x射线光谱证实了轻微的Ge相互扩散到GaAs核心。这项工作为控制不同通量比下的直径演变提供了预测框架,并为III-V /IV异质积分提供了见解。
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来源期刊
The Journal of Physical Chemistry C
The Journal of Physical Chemistry C 化学-材料科学:综合
CiteScore
6.50
自引率
8.10%
发文量
2047
审稿时长
1.8 months
期刊介绍: The Journal of Physical Chemistry A/B/C is devoted to reporting new and original experimental and theoretical basic research of interest to physical chemists, biophysical chemists, and chemical physicists.
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