Reinforcing the Structural, Dielectric, Conductivity, and Linear/Nonlinear Optical Properties of PS-Bi2O3-SiO2 Nanostructures for Radiation Protection and Optoelectronic Applications

IF 1.7 4区 物理与天体物理 Q2 PHYSICS, MULTIDISCIPLINARY
Majeed Ali Habeeb, Idrees Oreibi, Rehab Shather Abdul Hamza, Mamoun Fellah, Noureddine Elboughdiri
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引用次数: 0

Abstract

The objective of this work is to create innovative nanocomposite films by integrating nanostructures (bismuth oxide Bi2O3 and silicon dioxide SiO2) into polystyrene (PS). The primary objective of this study was to examine the structural and optical characteristics of nanostructures made up of PS-Bi2O3-SiO2. The FTIR spectra indicate the existence of a physical contact between the original polymer and nanoparticles. At a concentration of 6 wt.%, optical microscope findings indicate the formation of a cohesive network of (Bi2O3-SiO2) nanoparticles inside the polymer matrix, which is different from the pure (PS) film. The optical properties of pure PS, such as extinction coefficient (K), absorption index (α), absorbance (A), refractive index (n), and optical conductivity(σop), showed a positive correlation with the higher concentration of (Bi2O3-SiO2) nanoparticles. Thus, these findings indicate that the material may be appropriate for various optoelectronic devices, including solar cells, transistors, electronic gates, photovoltaic cells, lasers, diodes, and other related applications. The integration of nanoparticles leads to an increase in the third-order nonlinear susceptibility (χ(3)), linear susceptibility (χ(1)), Urbach energy (Eu), average oscillator wavelength (λo), nonlinear refractive index (n2), and static refractive index (no). Conversely, there is a noticeable reduction in the average oscillator strength (So), dispersion energy (Ed), and single-oscillator energy (Eosc). The analysis of the dielectric properties of (PS-Bi2O3-SiO2) nanocomposites revealed that an increase in the concentration of (Bi2O3-SiO2) nanoparticles resulted in a corresponding rise in the ε', ε", and σa.c of pure PS. The PS-Bi2O3-SiO2 nanocomposites show considerable gamma ray attenuation coefficients, according to the study. This paper suggests that these nanocomposites can be used in optoelectronic nanodevices and gamma radiation shielding.

增强PS-Bi2O3-SiO2纳米结构的结构、介电、电导率和线性/非线性光学性能,用于辐射防护和光电子应用
这项工作的目的是通过将纳米结构(氧化铋Bi2O3和二氧化硅SiO2)集成到聚苯乙烯(PS)中来制造创新的纳米复合薄膜。本研究的主要目的是研究由PS-Bi2O3-SiO2组成的纳米结构的结构和光学特性。FTIR光谱表明,原始聚合物与纳米颗粒之间存在物理接触。在6 wt.%的浓度下,光学显微镜观察发现聚合物基体内部形成了一个(Bi2O3-SiO2)纳米颗粒的内聚网络,这与纯(PS)膜不同。纯PS的消光系数(K)、吸收指数(α)、吸光度(A)、折射率(n)和光电导率(σop)等光学性质与(Bi2O3-SiO2)纳米粒子浓度的增加呈正相关。因此,这些发现表明该材料可能适用于各种光电子器件,包括太阳能电池、晶体管、电子门、光伏电池、激光器、二极管和其他相关应用。纳米粒子的集成导致了三阶非线性磁化率(χ(3))、线性磁化率(χ(1))、乌尔巴赫能量(Eu)、平均振子波长(λo)、非线性折射率(n2)和静态折射率(no)的增加。相反,平均振子强度(So)、色散能量(Ed)和单振子能量(Eosc)明显降低。对(PS-Bi2O3-SiO2)纳米复合材料介电性能的分析表明,随着(Bi2O3-SiO2)浓度的增加,纯PS的ε′、ε′和σa.c均相应升高,且PS-Bi2O3-SiO2纳米复合材料具有明显的γ射线衰减系数。本文认为这些纳米复合材料可用于光电纳米器件和伽马辐射屏蔽。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Brazilian Journal of Physics
Brazilian Journal of Physics 物理-物理:综合
CiteScore
2.50
自引率
6.20%
发文量
189
审稿时长
6.0 months
期刊介绍: The Brazilian Journal of Physics is a peer-reviewed international journal published by the Brazilian Physical Society (SBF). The journal publishes new and original research results from all areas of physics, obtained in Brazil and from anywhere else in the world. Contents include theoretical, practical and experimental papers as well as high-quality review papers. Submissions should follow the generally accepted structure for journal articles with basic elements: title, abstract, introduction, results, conclusions, and references.
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