{"title":"Data Reliability Testing Framework for Biometric Datasets Using Synthetic Iris and Fingerprint Images Generated via Deep Generative Models","authors":"Hyoungrae Kim;Hakil Kim","doi":"10.1109/ACCESS.2025.3604894","DOIUrl":null,"url":null,"abstract":"This paper presents a comprehensive data reliability testing framework for evaluating synthetic biometric data, addressing privacy concerns in fingerprint and iris recognition systems. This unified and modality-independent methodology establishes six quantitative metrics: randomness, quality similarity, attribute similarity, non-duplication, ID-preservation, and geometric diversity. The framework is implemented through a novel RD-Net architecture consisting of a Random Network for privacy protection and a Deterministic Network for maintaining essential biometric characteristics. Experiments using public datasets (FVC 2002, IITDelhi-Iris, and CASIA-Iris-V4) demonstrate that synthetic samples maintain high dissimilarity from source datasets while preserving their structural properties. The synthetic biometric data generated through the proposed Random Network and Deterministic Network architectures are evaluated using the data reliability testing framework, confirming distribution similarity with real data across all proposed metrics and achieving scores over 80. This approach offers a method for generating and evaluating synthetic biometric data that balances privacy protection with functional validity in biometric system development and testing.","PeriodicalId":13079,"journal":{"name":"IEEE Access","volume":"13 ","pages":"155084-155095"},"PeriodicalIF":3.6000,"publicationDate":"2025-09-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11146748","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Access","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/11146748/","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, INFORMATION SYSTEMS","Score":null,"Total":0}
引用次数: 0
Abstract
This paper presents a comprehensive data reliability testing framework for evaluating synthetic biometric data, addressing privacy concerns in fingerprint and iris recognition systems. This unified and modality-independent methodology establishes six quantitative metrics: randomness, quality similarity, attribute similarity, non-duplication, ID-preservation, and geometric diversity. The framework is implemented through a novel RD-Net architecture consisting of a Random Network for privacy protection and a Deterministic Network for maintaining essential biometric characteristics. Experiments using public datasets (FVC 2002, IITDelhi-Iris, and CASIA-Iris-V4) demonstrate that synthetic samples maintain high dissimilarity from source datasets while preserving their structural properties. The synthetic biometric data generated through the proposed Random Network and Deterministic Network architectures are evaluated using the data reliability testing framework, confirming distribution similarity with real data across all proposed metrics and achieving scores over 80. This approach offers a method for generating and evaluating synthetic biometric data that balances privacy protection with functional validity in biometric system development and testing.
IEEE AccessCOMPUTER SCIENCE, INFORMATION SYSTEMSENGIN-ENGINEERING, ELECTRICAL & ELECTRONIC
CiteScore
9.80
自引率
7.70%
发文量
6673
审稿时长
6 weeks
期刊介绍:
IEEE Access® is a multidisciplinary, open access (OA), applications-oriented, all-electronic archival journal that continuously presents the results of original research or development across all of IEEE''s fields of interest.
IEEE Access will publish articles that are of high interest to readers, original, technically correct, and clearly presented. Supported by author publication charges (APC), its hallmarks are a rapid peer review and publication process with open access to all readers. Unlike IEEE''s traditional Transactions or Journals, reviews are "binary", in that reviewers will either Accept or Reject an article in the form it is submitted in order to achieve rapid turnaround. Especially encouraged are submissions on:
Multidisciplinary topics, or applications-oriented articles and negative results that do not fit within the scope of IEEE''s traditional journals.
Practical articles discussing new experiments or measurement techniques, interesting solutions to engineering.
Development of new or improved fabrication or manufacturing techniques.
Reviews or survey articles of new or evolving fields oriented to assist others in understanding the new area.