{"title":"The Impact of Combining Datasets on the Robustness of Deep Learning Architectures: A Cross-Dataset Analysis","authors":"Ricardo Buettner;Susan Bertram;Leopold Fischer-Brandies","doi":"10.1109/ACCESS.2025.3604689","DOIUrl":null,"url":null,"abstract":"Convolutional Neural Networks have become a widely used technology. Typically, the performance of CNN models is measured using an accuracy score obtained on a single dataset. This often results in systems that perform significantly worse in real-world applications. The robustness of the model to unseen environments is still underresearched. Specifically, a research gap remains on how training data affects the robustness of deep learning systems. This research article investigates the impact of combining data in training datasets on the robustness and performance of deep learning models through a cross-dataset analysis. We employ a transfer learning approach to train deep learning models based on four popular architectures and two different datasets, as well as a combination of both datasets. Our results demonstrate that combining two datasets can improve robustness, but the specific effects on performance can vary between architectures, leading to a slight decrease in accuracy in most observed cases, or even an accuracy gain. Furthermore, we find that training on more complex datasets tends to outperform training on simpler datasets in cross-evaluation settings, indicating that models trained on more complex training datasets are more robust. However, we also observe that a simpler architecture fails to generalize when trained on the combined training data, indicating the need for caution and extensive evaluation when combining datasets during the development cycle of deep learning systems.","PeriodicalId":13079,"journal":{"name":"IEEE Access","volume":"13 ","pages":"151993-152009"},"PeriodicalIF":3.6000,"publicationDate":"2025-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11145443","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Access","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/11145443/","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, INFORMATION SYSTEMS","Score":null,"Total":0}
引用次数: 0
Abstract
Convolutional Neural Networks have become a widely used technology. Typically, the performance of CNN models is measured using an accuracy score obtained on a single dataset. This often results in systems that perform significantly worse in real-world applications. The robustness of the model to unseen environments is still underresearched. Specifically, a research gap remains on how training data affects the robustness of deep learning systems. This research article investigates the impact of combining data in training datasets on the robustness and performance of deep learning models through a cross-dataset analysis. We employ a transfer learning approach to train deep learning models based on four popular architectures and two different datasets, as well as a combination of both datasets. Our results demonstrate that combining two datasets can improve robustness, but the specific effects on performance can vary between architectures, leading to a slight decrease in accuracy in most observed cases, or even an accuracy gain. Furthermore, we find that training on more complex datasets tends to outperform training on simpler datasets in cross-evaluation settings, indicating that models trained on more complex training datasets are more robust. However, we also observe that a simpler architecture fails to generalize when trained on the combined training data, indicating the need for caution and extensive evaluation when combining datasets during the development cycle of deep learning systems.
IEEE AccessCOMPUTER SCIENCE, INFORMATION SYSTEMSENGIN-ENGINEERING, ELECTRICAL & ELECTRONIC
CiteScore
9.80
自引率
7.70%
发文量
6673
审稿时长
6 weeks
期刊介绍:
IEEE Access® is a multidisciplinary, open access (OA), applications-oriented, all-electronic archival journal that continuously presents the results of original research or development across all of IEEE''s fields of interest.
IEEE Access will publish articles that are of high interest to readers, original, technically correct, and clearly presented. Supported by author publication charges (APC), its hallmarks are a rapid peer review and publication process with open access to all readers. Unlike IEEE''s traditional Transactions or Journals, reviews are "binary", in that reviewers will either Accept or Reject an article in the form it is submitted in order to achieve rapid turnaround. Especially encouraged are submissions on:
Multidisciplinary topics, or applications-oriented articles and negative results that do not fit within the scope of IEEE''s traditional journals.
Practical articles discussing new experiments or measurement techniques, interesting solutions to engineering.
Development of new or improved fabrication or manufacturing techniques.
Reviews or survey articles of new or evolving fields oriented to assist others in understanding the new area.