{"title":"Back-to-basics tutorial: Secondary ion mass spectrometry (SIMS) in ceramics","authors":"Zonghao Shen, Sarah Fearn","doi":"10.1007/s10832-024-00375-9","DOIUrl":null,"url":null,"abstract":"<div><p>Secondary ion mass spectrometry (SIMS) is a sophisticated and powerful analytical technique to characterise the surface and sub-surface of materials. It has been widely used in materials science due to its trace level sensitivity to the full range of elements and isotopes, capability of profiling from surface to bulk, and various modes to provide information from the mass spectrum to 2D and 3D elemental distribution. In this article, we will discuss the working principles of SIMS, instrumentation information, issues related to measurements and data analysis with some case studies as well as the possible pitfalls. It will be by no means exhaustive for SIMS analysis but the aim of this article is to lower the boundaries for students and researchers who are going to perform their first SIMS analyses. The examples will be focused on solid state materials for energy applications only, albeit SIMS has been widely used for the surface analysis on all kinds of materials.</p></div>","PeriodicalId":625,"journal":{"name":"Journal of Electroceramics","volume":"53 2","pages":"103 - 130"},"PeriodicalIF":2.6000,"publicationDate":"2024-12-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://link.springer.com/content/pdf/10.1007/s10832-024-00375-9.pdf","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Electroceramics","FirstCategoryId":"88","ListUrlMain":"https://link.springer.com/article/10.1007/s10832-024-00375-9","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MATERIALS SCIENCE, CERAMICS","Score":null,"Total":0}
引用次数: 0
Abstract
Secondary ion mass spectrometry (SIMS) is a sophisticated and powerful analytical technique to characterise the surface and sub-surface of materials. It has been widely used in materials science due to its trace level sensitivity to the full range of elements and isotopes, capability of profiling from surface to bulk, and various modes to provide information from the mass spectrum to 2D and 3D elemental distribution. In this article, we will discuss the working principles of SIMS, instrumentation information, issues related to measurements and data analysis with some case studies as well as the possible pitfalls. It will be by no means exhaustive for SIMS analysis but the aim of this article is to lower the boundaries for students and researchers who are going to perform their first SIMS analyses. The examples will be focused on solid state materials for energy applications only, albeit SIMS has been widely used for the surface analysis on all kinds of materials.
期刊介绍：
While ceramics have traditionally been admired for their mechanical, chemical and thermal stability, their unique electrical, optical and magnetic properties have become of increasing importance in many key technologies including communications, energy conversion and storage, electronics and automation. Electroceramics benefit greatly from their versatility in properties including:
-insulating to metallic and fast ion conductivity
-piezo-, ferro-, and pyro-electricity
-electro- and nonlinear optical properties
-feromagnetism.
When combined with thermal, mechanical, and chemical stability, these properties often render them the materials of choice.
The Journal of Electroceramics is dedicated to providing a forum of discussion cutting across issues in electrical, optical, and magnetic ceramics. Driven by the need for miniaturization, cost, and enhanced functionality, the field of electroceramics is growing rapidly in many new directions. The Journal encourages discussions of resultant trends concerning silicon-electroceramic integration, nanotechnology, ceramic-polymer composites, grain boundary and defect engineering, etc.
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