Krishna Kumar Saxena , Muhammad Hazak Arshad , Dominiek Reynaerts
{"title":"AFM-ECM: Electrochemical micro/nano machining on an AFM platform","authors":"Krishna Kumar Saxena , Muhammad Hazak Arshad , Dominiek Reynaerts","doi":"10.1016/j.procir.2025.02.279","DOIUrl":null,"url":null,"abstract":"<div><div>Fabricating micro and nanostructures on materials that are challenging to cut remains a significant hurdle, with limited fabrication technologies available outside of cleanroom environments. The growing interest in tip-based micro/nano manufacturing presents a promising avenue to address this issue. Techniques like atomic force microscope (AFM) tip-based scratching and nanoindentation are advancing in this field. Electrochemical machining (ECM), with its non-contact nature and atomic-level dissolution, shows potential for downscaling. By controlling and localizing material removal through miniaturized tools and ultrashort voltage pulses, ECM can be downscaled while athermally machining difficult-to-cut materials. This study explores the integration of ECM with an AFM platform, termed as AFM-ECM. Utilizing a specialized AFM tip and short pulsed voltage, this method enables micro/nano-machining. The paper details the hardware specifications of a prototype desktop AFM-ECM setup and the process specifics. Experimental tests validate feasibility of this technology and highlight critical issues in the downscaling of ECM process.</div></div>","PeriodicalId":20535,"journal":{"name":"Procedia CIRP","volume":"137 ","pages":"Pages 288-295"},"PeriodicalIF":0.0000,"publicationDate":"2025-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Procedia CIRP","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S2212827125007206","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Fabricating micro and nanostructures on materials that are challenging to cut remains a significant hurdle, with limited fabrication technologies available outside of cleanroom environments. The growing interest in tip-based micro/nano manufacturing presents a promising avenue to address this issue. Techniques like atomic force microscope (AFM) tip-based scratching and nanoindentation are advancing in this field. Electrochemical machining (ECM), with its non-contact nature and atomic-level dissolution, shows potential for downscaling. By controlling and localizing material removal through miniaturized tools and ultrashort voltage pulses, ECM can be downscaled while athermally machining difficult-to-cut materials. This study explores the integration of ECM with an AFM platform, termed as AFM-ECM. Utilizing a specialized AFM tip and short pulsed voltage, this method enables micro/nano-machining. The paper details the hardware specifications of a prototype desktop AFM-ECM setup and the process specifics. Experimental tests validate feasibility of this technology and highlight critical issues in the downscaling of ECM process.