Fan Peng , Xuemei Song , Yiling Huang , Xingyu Jin , Yuqing Jiang , Yue Sun , Yi Zeng
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引用次数: 0
Abstract
Electron backscatter diffraction (EBSD) is an important technique based on the scanning electron microscope (SEM) that provides a wide range of crystallographic information. There are limited available pattern indexing methods and most of them are mastered by commercial instrument manufacturers, which may probably restrict the sharing and development of indexing techniques. In this study, we present a new EBSD pattern indexing method based on a three-dimensional parameter space. This method extends the characterization of characteristic triangles into a three-dimensional parameter space. This work details the procedure of the new indexing algorithm. The utility of this new method is demonstrated using experimental patterns captured from a cubic yttria-stabilized zirconia (YSZ) bulk sample. Compared with commercial indexing results, the new method shows excellent consistency and achieves better indexing performance at grain boundaries.
期刊介绍:
Ultramicroscopy is an established journal that provides a forum for the publication of original research papers, invited reviews and rapid communications. The scope of Ultramicroscopy is to describe advances in instrumentation, methods and theory related to all modes of microscopical imaging, diffraction and spectroscopy in the life and physical sciences.