Benchmarking Diffusion Annealing-Based Bayesian Inverse Problem Solvers

IF 2.7 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Evan Scope Crafts;Umberto Villa
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引用次数: 0

Abstract

In recent years, the ascendance of diffusion modeling as a state-of-the-art generative modeling approach has spurred significant interest in their use as priors in Bayesian inverse problems. However, it is unclear how to optimally integrate a diffusion model trained on the prior distribution with a given likelihood function to obtain posterior samples. While algorithms developed for this purpose can produce high-quality, diverse point estimates of the unknown parameters of interest, they are often tested on problems where the prior distribution is analytically unknown, making it difficult to assess their performance in providing rigorous uncertainty quantification. Motivated by this challenge, this work introduces three benchmark problems for evaluating the performance of diffusion model based samplers. The benchmark problems, which are inspired by problems in image inpainting, x-ray tomography, and phase retrieval, have a posterior density that is analytically known. In this setting, approximate ground-truth posterior samples can be obtained, enabling principled evaluation of the performance of posterior sampling algorithms. This work also introduces a general framework for diffusion model based posterior sampling, Bayesian Inverse Problem Solvers through Diffusion Annealing (BIPSDA). This framework unifies several recently proposed diffusion-model-based posterior sampling algorithms and contains novel algorithms that can be realized through flexible combinations of design choices. We tested the performance of a set of BIPSDA algorithms, including previously proposed state-of-the-art approaches, on the proposed benchmark problems. The results provide insight into the strengths and limitations of existing diffusion-model based posterior samplers, while the benchmark problems provide a testing ground for future algorithmic developments.
基于基准扩散退火的贝叶斯反问题求解方法
近年来,扩散建模作为最先进的生成建模方法的优势激发了人们对将其用作贝叶斯反问题先验的极大兴趣。然而,目前尚不清楚如何将先验分布训练的扩散模型与给定的似然函数最佳地整合以获得后验样本。虽然为此目的开发的算法可以产生高质量的、不同的未知感兴趣参数的点估计,但它们经常在先验分布分析未知的问题上进行测试,这使得很难评估它们在提供严格的不确定性量化方面的性能。在这一挑战的激励下,本文引入了三个基准问题来评估基于扩散模型的采样器的性能。基准问题的灵感来自图像绘制、x射线断层扫描和相位检索中的问题,它们具有分析已知的后验密度。在这种情况下,可以获得近似的真值后验样本,从而可以对后验抽样算法的性能进行原则性评估。本工作还介绍了基于后验抽样的扩散模型的一般框架,即通过扩散退火的贝叶斯反问题求解器(BIPSDA)。该框架统一了最近提出的几种基于扩散模型的后验抽样算法,并包含可以通过灵活组合设计选择来实现的新算法。我们在提出的基准问题上测试了一组BIPSDA算法的性能,包括以前提出的最先进的方法。结果提供了对现有的基于扩散模型的后验采样器的优势和局限性的洞察,而基准问题为未来的算法发展提供了一个试验场。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
CiteScore
5.30
自引率
0.00%
发文量
0
审稿时长
22 weeks
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