Anton Zubayer, Fredrik Eriksson, Naureen Ghafoor, Jochen Stahn, Jens Birch, Artur Glavic
{"title":"Optimization of magnetic reference layer for neutron reflectometry.","authors":"Anton Zubayer, Fredrik Eriksson, Naureen Ghafoor, Jochen Stahn, Jens Birch, Artur Glavic","doi":"10.1107/S1600576725004674","DOIUrl":null,"url":null,"abstract":"<p><p>Neutron reflectivity is a powerful technique for probing density profiles in films, with applications across physics, chemistry and biology. However, challenges arise when dealing with samples characterized by high roughness, unknown scattering length density (SLD) with low contrast, very thin layers or complex multi-layered structures that cannot be uniquely resolved due to the phase problem. Incorporating a magnetic reference layer (MRL) and using polarized neutron reflectivity improves the sensitivity and modelling accuracy by providing complementary information. In this study, we introduce a quantitative means of comparing MRL systems in a model-free way. We apply this approach to demonstrate that CoTi alloys offer a superior solution as MRLs compared with the commonly used Fe or Ni MRLs. The low nuclear and magnetic scattering length densities of CoTi significantly enhance sensitivity, making it particularly advantageous for soft-matter research. Furthermore, the tunable Co versus Ti ratio allows for optimization of the SLD to achieve maximum sensitivity, establishing CoTi as a highly effective choice for MRL applications. The applied simulation framework for optimizing MRL sensitivity to a specific materials system and research question is a generic approach that can be used prior to growing the MRL for a given experiment.</p>","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"58 Pt 4","pages":"1299-1310"},"PeriodicalIF":2.8000,"publicationDate":"2025-07-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12321035/pdf/","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Applied Crystallography","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1107/S1600576725004674","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2025/8/1 0:00:00","PubModel":"eCollection","JCR":"Q1","JCRName":"Biochemistry, Genetics and Molecular Biology","Score":null,"Total":0}
引用次数: 0
Abstract
Neutron reflectivity is a powerful technique for probing density profiles in films, with applications across physics, chemistry and biology. However, challenges arise when dealing with samples characterized by high roughness, unknown scattering length density (SLD) with low contrast, very thin layers or complex multi-layered structures that cannot be uniquely resolved due to the phase problem. Incorporating a magnetic reference layer (MRL) and using polarized neutron reflectivity improves the sensitivity and modelling accuracy by providing complementary information. In this study, we introduce a quantitative means of comparing MRL systems in a model-free way. We apply this approach to demonstrate that CoTi alloys offer a superior solution as MRLs compared with the commonly used Fe or Ni MRLs. The low nuclear and magnetic scattering length densities of CoTi significantly enhance sensitivity, making it particularly advantageous for soft-matter research. Furthermore, the tunable Co versus Ti ratio allows for optimization of the SLD to achieve maximum sensitivity, establishing CoTi as a highly effective choice for MRL applications. The applied simulation framework for optimizing MRL sensitivity to a specific materials system and research question is a generic approach that can be used prior to growing the MRL for a given experiment.
期刊介绍:
Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.