Stochastic dynamics of the resistively shunted superconducting tunnel junction system under the impact of thermal fluctuations

Abstract

In this work, a Josephson junction consisting of two superconducting layers sandwiching an insulating layer is explored, which is subject to the effects of thermal fluctuations. A clockwise hysteresis cycle in the current–voltage characteristic curve is demonstrated. Additionally, the bifurcation of a planar limit cycle is established. The numerous stochastic thermodynamic properties of the resistively shunted superconducting tunnel junction system are described, considering the influence of three specific parameters: conductance, current bias and noise intensity. Moreover, the probability density is characterized using the Fokker–Planck equation. Crucially, simulations reveal a regime of intermediate thermal noise intensities that maximizes metastable state lifetimes. This noise-enhanced stability effect, characterized by non-monotonic mean first passage time profiles, demonstrates how noise can stabilize or accelerate barrier escape.