{"title":"Investigation of the flicker of AMOLED pixel by trap-induced LTPS-TFT current fluctuation model","authors":"Haolin Li, Zheng Zhou, Xiaoyan Liu","doi":"10.1016/j.displa.2025.103155","DOIUrl":null,"url":null,"abstract":"<div><div>First frame drop (FFD), low-frequency flicker and various refresh rate (VRR) flicker of 7T1C active-matrix organic light emitting diode (AMOLED) are simulated in real time. By modeling the time-dependent trap capture/emission behavior, hysteresis and the current fluctuation of low-temperature polysilicon thin film transistors (LTPS-TFTs) are simulated. Then the proposed model is applied to the simulation of 7T1C AMOLED pixel. Three forms of flickers are simulated by the proposed trap-induced current fluctuation model and its dependence on frequency and trap properties are also evaluated. Our work provides a physical insight for the circuit transient analysis and a guideline for AMOLED pixel design regarding the reliability issue.</div></div>","PeriodicalId":50570,"journal":{"name":"Displays","volume":"90 ","pages":"Article 103155"},"PeriodicalIF":3.4000,"publicationDate":"2025-07-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Displays","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0141938225001921","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
First frame drop (FFD), low-frequency flicker and various refresh rate (VRR) flicker of 7T1C active-matrix organic light emitting diode (AMOLED) are simulated in real time. By modeling the time-dependent trap capture/emission behavior, hysteresis and the current fluctuation of low-temperature polysilicon thin film transistors (LTPS-TFTs) are simulated. Then the proposed model is applied to the simulation of 7T1C AMOLED pixel. Three forms of flickers are simulated by the proposed trap-induced current fluctuation model and its dependence on frequency and trap properties are also evaluated. Our work provides a physical insight for the circuit transient analysis and a guideline for AMOLED pixel design regarding the reliability issue.
期刊介绍:
Displays is the international journal covering the research and development of display technology, its effective presentation and perception of information, and applications and systems including display-human interface.
Technical papers on practical developments in Displays technology provide an effective channel to promote greater understanding and cross-fertilization across the diverse disciplines of the Displays community. Original research papers solving ergonomics issues at the display-human interface advance effective presentation of information. Tutorial papers covering fundamentals intended for display technologies and human factor engineers new to the field will also occasionally featured.