Stereological description of grain boundary driving and resisting pressures -Solution to the Smith/Zener model

IF 8.3 1区 材料科学 Q1 MATERIALS SCIENCE, MULTIDISCIPLINARY
Burton R. Patterson, Yixiong Liu
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Abstract

This paper presents a model for predicting second phase pinned grain size using a ratio of simple stereological terms- the length of grain boundary-second phase triple-line, LV, per grain boundary area, SVg. This pinning potential Z = LV /SVg= PA /PLg is straightforward to measure from counting triple points, PA, and test line intercepts PLg on the section plane. The measure of triple line per boundary area is the quantity Smith/Zener sought to quantify indirectly in their f/r model, these direct measurements not being available at the time. The above expression for Z encompasses the generally overlooked degree of non-random contact between the grain boundary and second phase, R. The final predictive model includes the stereologically measured boundary curvature,H¯, that drives grain growth, which Smith/Zener approximated as inverse grain size. These terms, which are easier to measure experimentally than f and r, were found to exert far greater effect on pinned grain size than the specific formulation of Z that has been the focus of many prior models. Testing was performed on sintered alumina with three levels of MgO doping causing widely different levels of grain boundary curvature and contact. Using this model the predicted grain sizes for this large variation in pinning conditions condensed to a single trend within experimental measurement error of the actual pinned grain size.

Abstract Image

晶界驱动和抗压的立体描述——Smith/Zener模型的解
本文提出了一个预测第二相固定晶粒尺寸的模型,该模型使用简单的立体学术语-晶界长度-第二相三线,LV,每晶界面积,SVg的比率。这个固定电位Z = LV /SVg= PA /PLg可以直接通过计算三相点、PA和测试线截距在剖面上的PLg来测量。史密斯/齐纳在他们的f/r模型中试图间接量化的是每个边界区域的三线测量,这些直接测量在当时是不可用的。上面Z的表达式包含了通常被忽略的晶界和第二相r之间的非随机接触程度。最后的预测模型包括了驱动晶粒生长的立体测量的边界曲率H¯,Smith/Zener将其近似为逆晶粒尺寸。这些项比f和r更容易在实验中测量,被发现对固定晶粒尺寸的影响远大于Z的特定公式,而Z是许多先前模型的重点。对三种不同程度的MgO掺杂的烧结氧化铝进行了测试,导致了不同程度的晶界曲率和接触。利用该模型,在实际钉住晶粒尺寸的实验测量误差范围内,对钉住条件变化较大的晶粒尺寸的预测浓缩为单一趋势。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Acta Materialia
Acta Materialia 工程技术-材料科学:综合
CiteScore
16.10
自引率
8.50%
发文量
801
审稿时长
53 days
期刊介绍: Acta Materialia serves as a platform for publishing full-length, original papers and commissioned overviews that contribute to a profound understanding of the correlation between the processing, structure, and properties of inorganic materials. The journal seeks papers with high impact potential or those that significantly propel the field forward. The scope includes the atomic and molecular arrangements, chemical and electronic structures, and microstructure of materials, focusing on their mechanical or functional behavior across all length scales, including nanostructures.
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