{"title":"Mechanism investigation of ductility improvement in heat-assisted nanocutting of single crystal silicon","authors":"Xiaonan Pu, Jianghai Xu, Peng Huang, Zhiwei Zhu","doi":"10.1016/j.jmapro.2025.06.012","DOIUrl":null,"url":null,"abstract":"<div><div>Single crystal silicon, which is widely used in multiple fields, is a typical difficult-to-machine material due to its hardness and brittleness. It has been demonstrated that elevated temperatures improve the ductility of single crystal silicon. However, the underlying mechanism of ductility improvement remains unclear, thereby constraining the advancement of ultra-precision cutting technology for single crystal silicon. In this study, a heat-assisted device with a heated tool is developed and utilized in the nanocutting of single crystal silicon. The scratch morphology indicates that the application of heat assistance up to 200 °C can enhance the brittle-to-ductile transition depth in single crystal silicon. Raman spectroscopy and transmission electron microscopy (TEM) were employed to examine the subsurface damage in the scratch. Furthermore, molecular dynamics (MD) simulations were conducted to elucidate the formation of chips and subsurface damage during heat-assisted nanocutting of single crystal silicon. By integrating the experimental and simulation results, it is evident that elevated temperatures enhance the ductile cutting of single crystal silicon by reducing the shearing resistance of amorphous silicon and promoting dislocations and slips in the single crystal substrate.</div></div>","PeriodicalId":16148,"journal":{"name":"Journal of Manufacturing Processes","volume":"150 ","pages":"Pages 599-609"},"PeriodicalIF":6.1000,"publicationDate":"2025-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Manufacturing Processes","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1526612525006711","RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, MANUFACTURING","Score":null,"Total":0}
引用次数: 0
Abstract
Single crystal silicon, which is widely used in multiple fields, is a typical difficult-to-machine material due to its hardness and brittleness. It has been demonstrated that elevated temperatures improve the ductility of single crystal silicon. However, the underlying mechanism of ductility improvement remains unclear, thereby constraining the advancement of ultra-precision cutting technology for single crystal silicon. In this study, a heat-assisted device with a heated tool is developed and utilized in the nanocutting of single crystal silicon. The scratch morphology indicates that the application of heat assistance up to 200 °C can enhance the brittle-to-ductile transition depth in single crystal silicon. Raman spectroscopy and transmission electron microscopy (TEM) were employed to examine the subsurface damage in the scratch. Furthermore, molecular dynamics (MD) simulations were conducted to elucidate the formation of chips and subsurface damage during heat-assisted nanocutting of single crystal silicon. By integrating the experimental and simulation results, it is evident that elevated temperatures enhance the ductile cutting of single crystal silicon by reducing the shearing resistance of amorphous silicon and promoting dislocations and slips in the single crystal substrate.
期刊介绍:
The aim of the Journal of Manufacturing Processes (JMP) is to exchange current and future directions of manufacturing processes research, development and implementation, and to publish archival scholarly literature with a view to advancing state-of-the-art manufacturing processes and encouraging innovation for developing new and efficient processes. The journal will also publish from other research communities for rapid communication of innovative new concepts. Special-topic issues on emerging technologies and invited papers will also be published.