SiO2/PEG Sol–Gel Hybrid Systems: Study of Morphological Features

Q3 Materials Science
Marialuigia Raimondo, Elisa Calabrese, Raffaele Longo, Michelina Catauro
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引用次数: 0

Abstract

In this work, atomic force microscopy (AFM) was used to evaluate the surface roughness of the inorganic–organic SiO2/polyethylene glycol (PEG) hybrid systems, appropriately synthesized via the sol–gel route for applications in the biomedical field, and their nanoscale surface morphology as a function of the different PEG amounts (6, 12, 24, 50 wt.% with respect to the silica content). The aim was to demonstrate the relationship between the surface roughness of the analyzed samples and their porosity. The surface roughness is enhanced with enhanced porosity which creates irregularities and variations on the surface topography and morphology of the rough nanostructured hybrids in which the organic and inorganic phases are bonded together at nanometer to sub-micrometer scales. The results revealed an increase in material porosity as a function of the PEG amount. The nanoscale roughness of the matrix SiO2 is relatively low, as confirmed by the roughness parameters Ra = 2.29 nm and Rq = 4.18 nm. Instead, for all SiO2/PEG hybrids, roughness values greater than those shown by the SiO2 matrix alone, which appear to gradually increase as the weight percentage of PEG increases, were detected. The findings showed that the amount of PEG in the analyzed systems increased the material porosity, underscoring the crucial role that PEG amount plays in compatibilizing the morphological characteristics of blends based on silica. This study opens the door to the realization that improving the sol–gel SiO2/PEG materials' porosity and roughness surfaces can have a variety of effects for various applications.

Abstract Image

SiO2/PEG溶胶-凝胶杂化体系的形态特征研究
在这项工作中,原子力显微镜(AFM)用于评估无机-有机SiO2/聚乙二醇(PEG)杂化体系的表面粗糙度,通过溶胶-凝胶途径适当合成用于生物医学领域,以及它们的纳米级表面形貌作为不同PEG含量(相对于二氧化硅含量的6,12,24,50 wt.%)的函数。目的是证明分析样品的表面粗糙度与其孔隙率之间的关系。表面粗糙度随着孔隙度的增加而增强,从而在粗糙的纳米结构杂化物的表面形貌和形貌上产生不规则性和变化,其中有机相和无机相在纳米到亚微米尺度上结合在一起。结果表明,材料孔隙率随PEG用量的增加而增加。从粗糙度参数Ra = 2.29 nm和Rq = 4.18 nm可以看出,SiO2基体的纳米级粗糙度相对较低。相反,对于所有SiO2/PEG杂化物,粗糙度值都大于SiO2基体单独显示的粗糙度值,并且随着PEG重量百分比的增加而逐渐增加。研究结果表明,在所分析的体系中,PEG的用量增加了材料的孔隙率,强调了PEG用量在增容二氧化硅基共混物的形态特征方面起着至关重要的作用。这项研究为改善溶胶-凝胶SiO2/PEG材料的孔隙率和表面粗糙度可以在各种应用中产生各种效果打开了大门。
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来源期刊
Macromolecular Symposia
Macromolecular Symposia Materials Science-Polymers and Plastics
CiteScore
1.50
自引率
0.00%
发文量
226
期刊介绍: Macromolecular Symposia presents state-of-the-art research articles in the field of macromolecular chemistry and physics. All submitted contributions are peer-reviewed to ensure a high quality of published manuscripts. Accepted articles will be typeset and published as a hardcover edition together with online publication at Wiley InterScience, thereby guaranteeing an immediate international dissemination.
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