Brian Johnstone , Jaime Berez , Caroline Massey , Elliott Jost , Christopher Saldana , Katherine Fu
{"title":"Effect of threshold parameters on infrared segmentation methods for porosity detection in electron beam powder bed fusion","authors":"Brian Johnstone , Jaime Berez , Caroline Massey , Elliott Jost , Christopher Saldana , Katherine Fu","doi":"10.1016/j.jmapro.2025.06.027","DOIUrl":null,"url":null,"abstract":"<div><div>In-situ process monitoring has seen significant interest in additive manufacturing to address qualification and certification goals. This is especially prevalent in metal powder bed fusion processes such as electron beam powder bed fusion (PBF-EB), with layer-wise infrared imaging being commonly used to detect defects. This work compares two different segmentation methods (static thresholding and statistical thresholding) used for detecting porosity from in-situ infrared imaging data for PBF-EB. Samples were manufactured at a variety of focus offset values to induce porosity. Then, the segmented infrared images were compared to ex-situ X-ray computed tomography scans, which served as a ground-truth reference for objective evaluation. Through this analysis framework, the influential parameters, static threshold and N-value (number of standard deviations above the mean pixel value), respectively, for both image segmentation methods were analyzed and compared for their effects on porosity detection. With optimal parameter settings, the two methods had similar porosity detection performance, but the statistical method performed better under a larger variety of parameter settings.</div></div>","PeriodicalId":16148,"journal":{"name":"Journal of Manufacturing Processes","volume":"149 ","pages":"Pages 1066-1077"},"PeriodicalIF":6.8000,"publicationDate":"2025-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Manufacturing Processes","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1526612525006851","RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, MANUFACTURING","Score":null,"Total":0}
引用次数: 0
Abstract
In-situ process monitoring has seen significant interest in additive manufacturing to address qualification and certification goals. This is especially prevalent in metal powder bed fusion processes such as electron beam powder bed fusion (PBF-EB), with layer-wise infrared imaging being commonly used to detect defects. This work compares two different segmentation methods (static thresholding and statistical thresholding) used for detecting porosity from in-situ infrared imaging data for PBF-EB. Samples were manufactured at a variety of focus offset values to induce porosity. Then, the segmented infrared images were compared to ex-situ X-ray computed tomography scans, which served as a ground-truth reference for objective evaluation. Through this analysis framework, the influential parameters, static threshold and N-value (number of standard deviations above the mean pixel value), respectively, for both image segmentation methods were analyzed and compared for their effects on porosity detection. With optimal parameter settings, the two methods had similar porosity detection performance, but the statistical method performed better under a larger variety of parameter settings.
期刊介绍:
The aim of the Journal of Manufacturing Processes (JMP) is to exchange current and future directions of manufacturing processes research, development and implementation, and to publish archival scholarly literature with a view to advancing state-of-the-art manufacturing processes and encouraging innovation for developing new and efficient processes. The journal will also publish from other research communities for rapid communication of innovative new concepts. Special-topic issues on emerging technologies and invited papers will also be published.