Junction temperature prediction Model Development with Co-simulation

Mustafa Ozden , Gokhan Ozkan , S M Imrat Rahman , Elutunji Buraimoh , Laxman Timilsina , Behnaz Papari , Christopher S. Edrington
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Abstract

This study examines the thermal behavior and junction temperature of MOSFET modules under varying operating conditions using ANSYS/Fluent software, with simulations managed through Python/Jupyter Notebook. Two different approaches are evaluated: the Temperature-Responsive Power Loss Calculation (TRPLC) and the Temperature-Agnostic Power Loss Calculation (TAPLC). In the TRPLC approach, power loss is calculated as a func- tion of the junction temperature, which is updated at each time step. In contrast, the TAPLC approach relies on four predefined power loss curves derived from the MOSFET datasheet, with each curve simulated separately. Unlike TRPLC, this method does not account for the relationship between junction temperature and power loss, resulting in significantly high junction temperature values at higher power loss levels. By dynamically recalculat- ing power loss at every step, the TRPLC approach provides more realistic results compared to TAPLC. These findings underscore the importance of incorporating temperature-dependent calculations to enhance the accuracy of thermal performance predictions under practical operational scenarios.
结合联合仿真的结温预测模型开发
本研究使用ANSYS/Fluent软件,通过Python/Jupyter Notebook进行模拟,研究了不同工作条件下MOSFET模块的热行为和结温。评估了两种不同的方法:温度响应功率损耗计算(TRPLC)和温度不可知功率损耗计算(TAPLC)。在TRPLC方法中,功耗作为结温的函数计算,结温在每个时间步长更新。相比之下,TAPLC方法依赖于从MOSFET数据表中导出的四条预定义的功率损耗曲线,每个曲线分别进行模拟。与TRPLC不同的是,该方法不考虑结温和功率损耗之间的关系,从而在更高的功率损耗水平下产生显着的高结温值。通过动态地重新计算每一步的功率损耗,与TAPLC相比,TRPLC方法提供了更真实的结果。这些发现强调了结合温度相关计算来提高实际操作场景下热性能预测准确性的重要性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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