Mustafa Ozden , Gokhan Ozkan , S M Imrat Rahman , Elutunji Buraimoh , Laxman Timilsina , Behnaz Papari , Christopher S. Edrington
{"title":"Junction temperature prediction Model Development with Co-simulation","authors":"Mustafa Ozden , Gokhan Ozkan , S M Imrat Rahman , Elutunji Buraimoh , Laxman Timilsina , Behnaz Papari , Christopher S. Edrington","doi":"10.1016/j.prime.2025.101033","DOIUrl":null,"url":null,"abstract":"<div><div>This study examines the thermal behavior and junction temperature of MOSFET modules under varying operating conditions using ANSYS/Fluent software, with simulations managed through Python/Jupyter Notebook. Two different approaches are evaluated: the Temperature-Responsive Power Loss Calculation (TRPLC) and the Temperature-Agnostic Power Loss Calculation (TAPLC). In the TRPLC approach, power loss is calculated as a func- tion of the junction temperature, which is updated at each time step. In contrast, the TAPLC approach relies on four predefined power loss curves derived from the MOSFET datasheet, with each curve simulated separately. Unlike TRPLC, this method does not account for the relationship between junction temperature and power loss, resulting in significantly high junction temperature values at higher power loss levels. By dynamically recalculat- ing power loss at every step, the TRPLC approach provides more realistic results compared to TAPLC. These findings underscore the importance of incorporating temperature-dependent calculations to enhance the accuracy of thermal performance predictions under practical operational scenarios.</div></div>","PeriodicalId":100488,"journal":{"name":"e-Prime - Advances in Electrical Engineering, Electronics and Energy","volume":"12 ","pages":"Article 101033"},"PeriodicalIF":0.0000,"publicationDate":"2025-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"e-Prime - Advances in Electrical Engineering, Electronics and Energy","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S2772671125001408","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This study examines the thermal behavior and junction temperature of MOSFET modules under varying operating conditions using ANSYS/Fluent software, with simulations managed through Python/Jupyter Notebook. Two different approaches are evaluated: the Temperature-Responsive Power Loss Calculation (TRPLC) and the Temperature-Agnostic Power Loss Calculation (TAPLC). In the TRPLC approach, power loss is calculated as a func- tion of the junction temperature, which is updated at each time step. In contrast, the TAPLC approach relies on four predefined power loss curves derived from the MOSFET datasheet, with each curve simulated separately. Unlike TRPLC, this method does not account for the relationship between junction temperature and power loss, resulting in significantly high junction temperature values at higher power loss levels. By dynamically recalculat- ing power loss at every step, the TRPLC approach provides more realistic results compared to TAPLC. These findings underscore the importance of incorporating temperature-dependent calculations to enhance the accuracy of thermal performance predictions under practical operational scenarios.