Simulation framework for electrical impedance Tomography systems

Q4 Engineering

Measurement Sensors Pub Date : 2025-05-01 DOI:10.1016/j.measen.2024.101416

Moritz Hollenberg , Tom Liebing , Thorsten A. Kern, Dennis Kähler

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Abstract

Electrical Impedance Tomography (EIT) is a promising approach for monitoring chemical processes and deriving process quantities. These insights then can be used for optimal control of the process.

The EIT hardware must be optimized for the specific requirements of the chemical reaction and its environment. Further influences come from the image reconstruction algorithms, which in turn are optimized for the process itself. This requires a large amount of data to be captured. We employ a hybrid approach using SPICE and COMSOL. Combining these methods we built a framework that is capable of generating simulated EIT data of a real world system enabling hardware optimization as well as algorithm optimization.

COMSOL is utilized to fit equivalent circuit models to the object under study, while SPICE simulates the output signal with noise introduced by discrete hardware components.

The simulation serves as a digital twin of a real system with which the generated signals are cross-validated.

With this framework, we are able to simulate data, reconstruct realistic images, and optimize for any custom-made system effectively.

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电阻抗层析成像系统的仿真框架

电阻抗层析成像（EIT）是一种很有前途的方法，用于监测化学过程和推导过程量。然后，这些见解可以用于过程的最佳控制。EIT硬件必须针对化学反应及其环境的特定要求进行优化。进一步的影响来自图像重建算法，而这些算法又针对过程本身进行了优化。这需要捕获大量的数据。我们采用SPICE和COMSOL的混合方法。结合这些方法，我们构建了一个框架，该框架能够生成真实世界系统的模拟EIT数据，从而实现硬件优化和算法优化。COMSOL用于拟合所研究对象的等效电路模型，SPICE用于模拟由离散硬件元件引入的噪声的输出信号。仿真作为真实系统的数字孪生，生成的信号与真实系统进行交叉验证。有了这个框架，我们能够模拟数据，重建真实的图像，并有效地优化任何定制系统。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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