The Effect of an Al2O3 Layer on the Structural and Temperature-Dependent Magnetic Characteristics of Thin Cobalt Films

Abstract

The cobalt films deposited using the magnetron method on an amorphous Al₂O₃ layer have been studied. The morphological and magnetic features determined by the formation of a naturally oxidized antiferromagnetic film on cobalt and the Al₂O₃/Co interface have been studied. A change in the sign of the exchange bias at temperatures below 200 K has been detected when the cobalt layer thickness on the Al₂O₃ film is more than 10 nm.