Jong-Hyeon Baek;Hyo-Jun Lee;Hanul Kim;Yeong Jun Koh
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引用次数: 0
Abstract
Images captured with wrong exposure conditions inevitably produce unsatisfactory visual effects. Thus, multiple exposure correction has drawn much attention, which should correct for degraded images due to various wrong exposure conditions. However, the problem of handling the different nature of underexposed and overexposed images makes this task challenging. In this work, we introduce the novel multiple exposure correction transformer, named MECFormer, to tackle this problem. MECFormer consists of autoencoder, encoder, and dual-path aggregation decoder. First, the autoencoder extracts multi-scale exposure features representing the level of input exposure. Second, the encoder embeds input images into multi-scale image features. Third, the dual-path aggregation decoder sequentially restores exposures by effectively aggregating multi-scale exposure features and image features. MECFormer achieves the state-of-the art performance on two multi-exposure correction datasets. Also, we provide extensive ablation studies to show the effectiveness of the proposed components.
IEEE AccessCOMPUTER SCIENCE, INFORMATION SYSTEMSENGIN-ENGINEERING, ELECTRICAL & ELECTRONIC
CiteScore
9.80
自引率
7.70%
发文量
6673
审稿时长
6 weeks
期刊介绍:
IEEE Access® is a multidisciplinary, open access (OA), applications-oriented, all-electronic archival journal that continuously presents the results of original research or development across all of IEEE''s fields of interest.
IEEE Access will publish articles that are of high interest to readers, original, technically correct, and clearly presented. Supported by author publication charges (APC), its hallmarks are a rapid peer review and publication process with open access to all readers. Unlike IEEE''s traditional Transactions or Journals, reviews are "binary", in that reviewers will either Accept or Reject an article in the form it is submitted in order to achieve rapid turnaround. Especially encouraged are submissions on:
Multidisciplinary topics, or applications-oriented articles and negative results that do not fit within the scope of IEEE''s traditional journals.
Practical articles discussing new experiments or measurement techniques, interesting solutions to engineering.
Development of new or improved fabrication or manufacturing techniques.
Reviews or survey articles of new or evolving fields oriented to assist others in understanding the new area.