{"title":"Precision Synchronous Control of Multiple Motion Systems: A Tube-Based MPC Approach","authors":"Shuaiqi Chen;Fazhi Song;Yue Dong;Ning Cui;Yang Liu;Xinkai Chen","doi":"10.1109/JAS.2025.125222","DOIUrl":null,"url":null,"abstract":"Lithography machines operate in scanning mode for the fabrication of large-scale integrated circuits (ICs), requiring high-precision synchronous motion between the reticle and wafer stages. Disturbances generated by each stage during high-acceleration movements are transmitted through the base frame, resulting in degradation of synchronization performance. To address this challenge, this paper proposes a tube-based model predictive control (tube-MPC) approach for synchronization in lithography machines. First, the proposed modeling method accurately characterizes the coupling disturbances and synchronization dynamics. Subsequently, a tube-MPC approach is developed to ensure that the states of the nominal system are constrained within the terminal constraint set. To reduce the complexity of online computations, an approach is employed to transform online optimization problems into offline problems by creating an online lookup table. This enables the determination of optimal control inputs via a simplified online optimization algorithm. The robustness and trajectory tracking performance of the proposed approach are verified through simulation experiments, demonstrating its effectiveness in enhancing the synchronization performance of multiple motion systems.","PeriodicalId":54230,"journal":{"name":"Ieee-Caa Journal of Automatica Sinica","volume":"12 5","pages":"974-988"},"PeriodicalIF":15.3000,"publicationDate":"2025-03-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Ieee-Caa Journal of Automatica Sinica","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/11005745/","RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"AUTOMATION & CONTROL SYSTEMS","Score":null,"Total":0}
引用次数: 0
Abstract
Lithography machines operate in scanning mode for the fabrication of large-scale integrated circuits (ICs), requiring high-precision synchronous motion between the reticle and wafer stages. Disturbances generated by each stage during high-acceleration movements are transmitted through the base frame, resulting in degradation of synchronization performance. To address this challenge, this paper proposes a tube-based model predictive control (tube-MPC) approach for synchronization in lithography machines. First, the proposed modeling method accurately characterizes the coupling disturbances and synchronization dynamics. Subsequently, a tube-MPC approach is developed to ensure that the states of the nominal system are constrained within the terminal constraint set. To reduce the complexity of online computations, an approach is employed to transform online optimization problems into offline problems by creating an online lookup table. This enables the determination of optimal control inputs via a simplified online optimization algorithm. The robustness and trajectory tracking performance of the proposed approach are verified through simulation experiments, demonstrating its effectiveness in enhancing the synchronization performance of multiple motion systems.
期刊介绍:
The IEEE/CAA Journal of Automatica Sinica is a reputable journal that publishes high-quality papers in English on original theoretical/experimental research and development in the field of automation. The journal covers a wide range of topics including automatic control, artificial intelligence and intelligent control, systems theory and engineering, pattern recognition and intelligent systems, automation engineering and applications, information processing and information systems, network-based automation, robotics, sensing and measurement, and navigation, guidance, and control.
Additionally, the journal is abstracted/indexed in several prominent databases including SCIE (Science Citation Index Expanded), EI (Engineering Index), Inspec, Scopus, SCImago, DBLP, CNKI (China National Knowledge Infrastructure), CSCD (Chinese Science Citation Database), and IEEE Xplore.