Steel Defect Detection Based on YOLO-SAFD

IF 3.4 3区 计算机科学 Q2 COMPUTER SCIENCE, INFORMATION SYSTEMS
Feihong Yu;Jinshan Zhang;Dingdiao Mu
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Abstract

In industrial production, defect detection of steel materials is critical for maintaining quality. However, traditional inspection methods are labor-intensive and error-prone, while existing deep learning-based detection approaches generally suffer from poor performance in industrial defect detection and insensitivity to small defects. This paper presents YOLO-SAFD, an advanced framework based on YOLOv5, designed to address these challenges. The proposed model incorporates two key innovations: 1) the Squeezed and Excited Asymptotic Feature Pyramid Network (SAFPN), which enhances multi-scale feature fusion and improves the detection of small defects, increasing the mean Average Precision (mAP) from 0.78 (YOLOv5 baseline) to 0.84; 2) the Diverse Branch Block (DBB), which replaces conventional convolutions to enrich feature diversity while reducing computational complexity, cutting the model parameters from 13.8M to 4.82M. Experimental results on the NEU-DET dataset demonstrate that YOLO-SAFD achieves a detection precision of 0.83, a recall of 0.75, and an mAP50:95 of 0.43, outperforming the baseline YOLOv5 and highlighting its superior detection accuracy and efficiency for real-time industrial applications.
基于YOLO-SAFD的钢材缺陷检测
在工业生产中,钢材的缺陷检测是保证质量的关键。然而,传统的检测方法是劳动密集型的,容易出错,而现有的基于深度学习的检测方法在工业缺陷检测中普遍存在性能不佳和对小缺陷不敏感的问题。本文提出了基于YOLOv5的高级框架yolov - safd,旨在解决这些挑战。该模型包含两个关键创新:1)压缩和激励渐近特征金字塔网络(SAFPN)增强了多尺度特征融合,提高了小缺陷的检测能力,将平均平均精度(mAP)从0.78 (YOLOv5基线)提高到0.84;2)多元分支块(DBB),它取代了传统的卷积,丰富了特征的多样性,同时降低了计算复杂度,将模型参数从13.8M削减到4.82M。在nue - det数据集上的实验结果表明,yolov - safd的检测精度为0.83,召回率为0.75,mAP50:95为0.43,优于基线YOLOv5,突出了其在实时工业应用中的优越检测精度和效率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
IEEE Access
IEEE Access COMPUTER SCIENCE, INFORMATION SYSTEMSENGIN-ENGINEERING, ELECTRICAL & ELECTRONIC
CiteScore
9.80
自引率
7.70%
发文量
6673
审稿时长
6 weeks
期刊介绍: IEEE Access® is a multidisciplinary, open access (OA), applications-oriented, all-electronic archival journal that continuously presents the results of original research or development across all of IEEE''s fields of interest. IEEE Access will publish articles that are of high interest to readers, original, technically correct, and clearly presented. Supported by author publication charges (APC), its hallmarks are a rapid peer review and publication process with open access to all readers. Unlike IEEE''s traditional Transactions or Journals, reviews are "binary", in that reviewers will either Accept or Reject an article in the form it is submitted in order to achieve rapid turnaround. Especially encouraged are submissions on: Multidisciplinary topics, or applications-oriented articles and negative results that do not fit within the scope of IEEE''s traditional journals. Practical articles discussing new experiments or measurement techniques, interesting solutions to engineering. Development of new or improved fabrication or manufacturing techniques. Reviews or survey articles of new or evolving fields oriented to assist others in understanding the new area.
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