{"title":"Steel Defect Detection Based on YOLO-SAFD","authors":"Feihong Yu;Jinshan Zhang;Dingdiao Mu","doi":"10.1109/ACCESS.2025.3565587","DOIUrl":null,"url":null,"abstract":"In industrial production, defect detection of steel materials is critical for maintaining quality. However, traditional inspection methods are labor-intensive and error-prone, while existing deep learning-based detection approaches generally suffer from poor performance in industrial defect detection and insensitivity to small defects. This paper presents YOLO-SAFD, an advanced framework based on YOLOv5, designed to address these challenges. The proposed model incorporates two key innovations: 1) the Squeezed and Excited Asymptotic Feature Pyramid Network (SAFPN), which enhances multi-scale feature fusion and improves the detection of small defects, increasing the mean Average Precision (mAP) from 0.78 (YOLOv5 baseline) to 0.84; 2) the Diverse Branch Block (DBB), which replaces conventional convolutions to enrich feature diversity while reducing computational complexity, cutting the model parameters from 13.8M to 4.82M. Experimental results on the NEU-DET dataset demonstrate that YOLO-SAFD achieves a detection precision of 0.83, a recall of 0.75, and an mAP50:95 of 0.43, outperforming the baseline YOLOv5 and highlighting its superior detection accuracy and efficiency for real-time industrial applications.","PeriodicalId":13079,"journal":{"name":"IEEE Access","volume":"13 ","pages":"77291-77304"},"PeriodicalIF":3.4000,"publicationDate":"2025-04-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10979992","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Access","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10979992/","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, INFORMATION SYSTEMS","Score":null,"Total":0}
引用次数: 0
Abstract
In industrial production, defect detection of steel materials is critical for maintaining quality. However, traditional inspection methods are labor-intensive and error-prone, while existing deep learning-based detection approaches generally suffer from poor performance in industrial defect detection and insensitivity to small defects. This paper presents YOLO-SAFD, an advanced framework based on YOLOv5, designed to address these challenges. The proposed model incorporates two key innovations: 1) the Squeezed and Excited Asymptotic Feature Pyramid Network (SAFPN), which enhances multi-scale feature fusion and improves the detection of small defects, increasing the mean Average Precision (mAP) from 0.78 (YOLOv5 baseline) to 0.84; 2) the Diverse Branch Block (DBB), which replaces conventional convolutions to enrich feature diversity while reducing computational complexity, cutting the model parameters from 13.8M to 4.82M. Experimental results on the NEU-DET dataset demonstrate that YOLO-SAFD achieves a detection precision of 0.83, a recall of 0.75, and an mAP50:95 of 0.43, outperforming the baseline YOLOv5 and highlighting its superior detection accuracy and efficiency for real-time industrial applications.
IEEE AccessCOMPUTER SCIENCE, INFORMATION SYSTEMSENGIN-ENGINEERING, ELECTRICAL & ELECTRONIC
CiteScore
9.80
自引率
7.70%
发文量
6673
审稿时长
6 weeks
期刊介绍:
IEEE Access® is a multidisciplinary, open access (OA), applications-oriented, all-electronic archival journal that continuously presents the results of original research or development across all of IEEE''s fields of interest.
IEEE Access will publish articles that are of high interest to readers, original, technically correct, and clearly presented. Supported by author publication charges (APC), its hallmarks are a rapid peer review and publication process with open access to all readers. Unlike IEEE''s traditional Transactions or Journals, reviews are "binary", in that reviewers will either Accept or Reject an article in the form it is submitted in order to achieve rapid turnaround. Especially encouraged are submissions on:
Multidisciplinary topics, or applications-oriented articles and negative results that do not fit within the scope of IEEE''s traditional journals.
Practical articles discussing new experiments or measurement techniques, interesting solutions to engineering.
Development of new or improved fabrication or manufacturing techniques.
Reviews or survey articles of new or evolving fields oriented to assist others in understanding the new area.