Quantitative Method for Ultrasonic Testing of Lead Seal Defects in High Voltage Cable Accessories

IF 3.4 3区计算机科学 Q2 COMPUTER SCIENCE, INFORMATION SYSTEMS

IEEE Access Pub Date : 2025-04-29 DOI:10.1109/ACCESS.2025.3565290

Zheng Hai;Cai Qiushen;Zheng Jishi;Zhen Zhiming;Zou Wei;Chen Jianping

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引用次数: 0

Abstract

Phased array ultrasound technology has demonstrated its capability in detecting lead seal defects within high-voltage cable terminals. However, conventional ultrasound quantitative methods often fall short in accurately measuring the dimensions of these defects. This paper introduces a novel method for the detection and quantification of lead seal defects in high-voltage cable terminals. By focusing on the longitudinal wave fan scan images of these defects and integrating threshold segmentation with corrosion algorithms, the method provides real-time information on defect characteristics, including cross-sectional area and height. The findings reveal significant improvements over the traditional −6dB method: a 5% reduction in distance error, a 10% enhancement in defect size accuracy, and an overall accuracy rate exceeding 85%. This research holds substantial reference value for the engineering application of lead sealing defect detection in high-voltage cables, contributing to the advancement of lead sealing technology and ensuring the reliability and safety of power grid operations.

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高压电缆附件铅封缺陷的超声定量检测方法

相控阵超声技术在检测高压电缆端头铅封缺陷方面已得到广泛应用。然而，传统的超声定量方法往往不能准确测量这些缺陷的尺寸。本文介绍了一种检测和定量高压电缆端子铅封缺陷的新方法。该方法通过关注这些缺陷的纵波扇扫描图像，并将阈值分割与腐蚀算法相结合，提供缺陷特征的实时信息，包括横截面积和高度。研究结果表明，与传统的- 6dB方法相比，该方法有了显著的改进：距离误差降低5%，缺陷尺寸精度提高10%，总体准确率超过85%。本研究对高压电缆铅封缺陷检测的工程应用具有重要的参考价值，有助于铅封技术的进步，确保电网运行的可靠性和安全性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

IEEE Access COMPUTER SCIENCE, INFORMATION SYSTEMSENGIN-ENGINEERING, ELECTRICAL & ELECTRONIC

CiteScore

9.80

自引率

7.70%

发文量

6673

审稿时长

6 weeks

期刊介绍： IEEE Access® is a multidisciplinary, open access (OA), applications-oriented, all-electronic archival journal that continuously presents the results of original research or development across all of IEEE''s fields of interest. IEEE Access will publish articles that are of high interest to readers, original, technically correct, and clearly presented. Supported by author publication charges (APC), its hallmarks are a rapid peer review and publication process with open access to all readers. Unlike IEEE''s traditional Transactions or Journals, reviews are "binary", in that reviewers will either Accept or Reject an article in the form it is submitted in order to achieve rapid turnaround. Especially encouraged are submissions on: Multidisciplinary topics, or applications-oriented articles and negative results that do not fit within the scope of IEEE''s traditional journals. Practical articles discussing new experiments or measurement techniques, interesting solutions to engineering. Development of new or improved fabrication or manufacturing techniques. Reviews or survey articles of new or evolving fields oriented to assist others in understanding the new area.