Record-Breaking Display Week 2025 Promises to be Memorable

Q4 Engineering
Stephen P. Atwood
{"title":"Record-Breaking Display Week 2025 Promises to be Memorable","authors":"Stephen P. Atwood","doi":"10.1002/msid.1573","DOIUrl":null,"url":null,"abstract":"<div>\n \n <p>Welcome to our annual Display Week issue! SID is heading to San Jose, California May 11–16 for another great international conference and exposition. If this is your first time attending Display Week, I hope you find this a truly memorable experience.</p>\n </div>","PeriodicalId":52450,"journal":{"name":"Information Display","volume":"41 3","pages":"3-4"},"PeriodicalIF":0.0000,"publicationDate":"2025-05-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1002/msid.1573","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Information Display","FirstCategoryId":"1085","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.1002/msid.1573","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"Engineering","Score":null,"Total":0}
引用次数: 0

Abstract

Welcome to our annual Display Week issue! SID is heading to San Jose, California May 11–16 for another great international conference and exposition. If this is your first time attending Display Week, I hope you find this a truly memorable experience.

Abstract Image

破纪录的2025年展示周将令人难忘
欢迎来到我们的年度展示周!SID将于5月11日至16日前往加州圣何塞,参加另一个伟大的国际会议和博览会。如果这是你第一次参加展览周,我希望你觉得这是一次真正难忘的经历。
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来源期刊
Information Display
Information Display Engineering-Electrical and Electronic Engineering
CiteScore
1.40
自引率
0.00%
发文量
85
期刊介绍: Information Display Magazine invites other opinions on editorials or other subjects from members of the international display community. We welcome your comments and suggestions.
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