Grain boundary properties and microstructure evolution in an Al-Cu alloy

IF 8.3 1区 材料科学 Q1 MATERIALS SCIENCE, MULTIDISCIPLINARY
Zipeng Xu, Jun Sun, Jules M. Dake, Jette Oddershede, Harpreet Kaur, S. Kiana Naghibzadeh, Carl E. Krill, Kaushik Dayal, Gregory S. Rohrer
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Abstract

Grain boundary (GB) properties in an Al-5 wt % Cu alloy have been extracted from diffraction contrast tomography images after 10 sequential annealing steps for 15 min at 630°C. At the annealing temperature, a copper-rich liquid was present at the GBs. The growth and shrinkage of the grains are strongly correlated with the grain size, and the velocity of individual boundaries is strongly correlated with boundary mean curvature, as expected from the classical theory of coarsening. The experimental results compare well to a threshold dynamics grain growth simulation of the process assuming uniform grain boundary energies. The correlation of the interface velocity and curvature is observed both for the data on average and for certain commonly occurring grain boundary disorientations. It is also found that the curvatures and relative areas of GBs depend on the five grain boundary parameters, even though the GBs are formed in conditions of low energy anisotropy. The observations are compared to results from grain growth in the solid state, where strong correlations between interface velocity and curvature are not observed.

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来源期刊
Acta Materialia
Acta Materialia 工程技术-材料科学:综合
CiteScore
16.10
自引率
8.50%
发文量
801
审稿时长
53 days
期刊介绍: Acta Materialia serves as a platform for publishing full-length, original papers and commissioned overviews that contribute to a profound understanding of the correlation between the processing, structure, and properties of inorganic materials. The journal seeks papers with high impact potential or those that significantly propel the field forward. The scope includes the atomic and molecular arrangements, chemical and electronic structures, and microstructure of materials, focusing on their mechanical or functional behavior across all length scales, including nanostructures.
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