Jingwen Yuan, Kaizhou Gao, Adam Slowik, Benxue Lu, Yanan Jia
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引用次数: 0
Abstract
The reentrant flowshop scheduling problems (RFSP) are ubiquitous in high-tech industries such as semiconductor manufacturing and liquid crystal display (LCD) production. Given the complexity of RFSP, it is significant to improve the production efficiency using effective intelligent optimisation techniques. In this study, four meta-heuristics assisted by two reinforcement learning (RL) algorithms are proposed to minimise the maximum completion time (makespan) for RFSP. First, a mathematical model for RFSP is established. Second, four meta-heuristics are improved. The Nawaz–Enscore–Ham (NEH) heuristic is utilised for population initialisation. Based on the problem characteristics, we design six local search operators, which are integrated into the four meta-heuristics. Third, two RL algorithms, Q-learning and state–action-reward–state–action (SARSA), are employed to select the appropriate local search operator during iterations to enhance the convergence in a local space. Finally, the results of solving 72 instances indicate that the proposed algorithms perform effectively. The RL-guided local search can significantly enhance the overall performance of the four meta-heuristics. In particular, the artificial bee colony algorithm (ABC) combined with SARSA-guided local search yields the highest performance.
期刊介绍:
IET Collaborative Intelligent Manufacturing is a Gold Open Access journal that focuses on the development of efficient and adaptive production and distribution systems. It aims to meet the ever-changing market demands by publishing original research on methodologies and techniques for the application of intelligence, data science, and emerging information and communication technologies in various aspects of manufacturing, such as design, modeling, simulation, planning, and optimization of products, processes, production, and assembly.
The journal is indexed in COMPENDEX (Elsevier), Directory of Open Access Journals (DOAJ), Emerging Sources Citation Index (Clarivate Analytics), INSPEC (IET), SCOPUS (Elsevier) and Web of Science (Clarivate Analytics).