{"title":"A critical step toward far-field laboratory diffraction contrast tomography in Laue focusing geometry.","authors":"Yubin Zhang, Adam Lindkvist","doi":"10.1107/S1600576725001396","DOIUrl":null,"url":null,"abstract":"<p><p>Recent simulations have demonstrated the promising potential of far-field laboratory diffraction contrast tomography (FF-LabDCT) in the Laue focusing geometry for 3D mapping of grain-averaged deviatoric strain tensors, achieving a strain uncertainty as low as 1 × 10<sup>-4</sup> [Lindkvist & Zhang (2022). <i>J. Appl. Cryst.</i> <b>55</b>, 21-32]. The present work takes a critical step towards realizing this tool. It presents the first attempt at implementing FF-LabDCT using a Zeiss Xradia 520 Versa X-ray microscope, including both hardware and software development. A new algorithm, LabDBB, which adapts the previously developed dictionary-based branch and bound (DBB) principles, is implemented for indexing FF-LabDCT data. The performance of LabDBB is evaluated by comparing the indexed grain crystallographic orientations and center of mass positions with those obtained using near-field LabDCT within the same gauge volume of a fully recrystallized iron sample. Finally, the challenges related to fitting the grain-averaged deviatoric strain tensor using the current FF-LabDCT setup are identified. The strain analysis suggests that, once these challenges are addressed, a strain uncertainty as low as 2 × 10<sup>-4</sup> could potentially be achieved. This work demonstrates the possibility for developing a tool capable of 3D grain-scale strain analysis with high strain precision in home laboratories.</p>","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"58 Pt 2","pages":"447-457"},"PeriodicalIF":6.1000,"publicationDate":"2025-03-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11957408/pdf/","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Applied Crystallography","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1107/S1600576725001396","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2025/4/1 0:00:00","PubModel":"eCollection","JCR":"Q1","JCRName":"Biochemistry, Genetics and Molecular Biology","Score":null,"Total":0}
引用次数: 0
Abstract
Recent simulations have demonstrated the promising potential of far-field laboratory diffraction contrast tomography (FF-LabDCT) in the Laue focusing geometry for 3D mapping of grain-averaged deviatoric strain tensors, achieving a strain uncertainty as low as 1 × 10-4 [Lindkvist & Zhang (2022). J. Appl. Cryst.55, 21-32]. The present work takes a critical step towards realizing this tool. It presents the first attempt at implementing FF-LabDCT using a Zeiss Xradia 520 Versa X-ray microscope, including both hardware and software development. A new algorithm, LabDBB, which adapts the previously developed dictionary-based branch and bound (DBB) principles, is implemented for indexing FF-LabDCT data. The performance of LabDBB is evaluated by comparing the indexed grain crystallographic orientations and center of mass positions with those obtained using near-field LabDCT within the same gauge volume of a fully recrystallized iron sample. Finally, the challenges related to fitting the grain-averaged deviatoric strain tensor using the current FF-LabDCT setup are identified. The strain analysis suggests that, once these challenges are addressed, a strain uncertainty as low as 2 × 10-4 could potentially be achieved. This work demonstrates the possibility for developing a tool capable of 3D grain-scale strain analysis with high strain precision in home laboratories.
期刊介绍:
Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.