Solvent-annealing-induced microphase separation in polyether polyurethane: a small-angle X-ray scattering study.

Abstract

This study investigated the effects of solvent vapor annealing on the microphase separation structure of polyurethane (PU) using small-angle X-ray scattering (SAXS) and complementary techniques. Solvent annealing, as an alternative to thermal annealing, offers a lower-temperature method to refine the microstructure of PU. We examined the impact of methyl ethyl ketone (MEK), acetone and toluene vapors on a commercial polyether PU, focusing on changes in microphase structure, adsorption kinetics and thermal stability. The SAXS data, analyzed by a polydisperse hard-sphere model, indicated that the degree of phase separation increased upon solvent annealing, and the order of influence exerted by the solvent vapors on the microphase structure follows MEK > acetone > toluene. The in situ variable-temperature SAXS results showed that the solvent-annealed sample had superior thermal stability to the quenched sample. Compared with high-temperature annealing, solvent annealing induced a higher degree of phase separation but did not lead to significant growth of the hard-urethane-segment-rich domains. These findings provide valuable insights into optimizing solvent annealing processes, allowing for advanced applications of PUs where excessive heat may lead to degradation or other undesirable changes.