Exploring Beyond Logits: Hierarchical Dynamic Labeling Based on Embeddings for Semi-Supervised Classification

IF 3.4 3区 计算机科学 Q2 COMPUTER SCIENCE, INFORMATION SYSTEMS
Jiayi Chen;Yanbiao Ma;Wei Dai;Xiaohua Chen;Shuo Li
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引用次数: 0

Abstract

In semi-supervised learning, methods that rely on confidence learning to generate pseudo-labels have been widely proposed. However, increasing research finds that when faced with noisy and biased data, the model’s representation network is more reliable than the classification network. Additionally, label generation methods based on model predictions often show poor adaptability across different datasets, necessitating customization of the classification network. Therefore, we propose a Hierarchical Dynamic Labeling (HDL) algorithm that does not depend on model predictions and utilizes image embeddings to generate sample labels. We also introduce an adaptive method for selecting hyperparameters in HDL, enhancing its versatility. Moreover, HDL can be combined with general image encoders (e.g., CLIP) to serve as a fundamental data processing module. We extract embeddings from datasets with class-balanced and long-tailed distributions using pre-trained semi-supervised models. Subsequently, samples are re-labeled using HDL, and the re-labeled samples are used to further train the semi-supervised models. Experiments demonstrate improved model performance, validating the motivation that representation networks are more reliable than classifiers or predictors. Our approach has the potential to change the paradigm of pseudo-label generation in semi-supervised learning.
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来源期刊
IEEE Access
IEEE Access COMPUTER SCIENCE, INFORMATION SYSTEMSENGIN-ENGINEERING, ELECTRICAL & ELECTRONIC
CiteScore
9.80
自引率
7.70%
发文量
6673
审稿时长
6 weeks
期刊介绍: IEEE Access® is a multidisciplinary, open access (OA), applications-oriented, all-electronic archival journal that continuously presents the results of original research or development across all of IEEE''s fields of interest. IEEE Access will publish articles that are of high interest to readers, original, technically correct, and clearly presented. Supported by author publication charges (APC), its hallmarks are a rapid peer review and publication process with open access to all readers. Unlike IEEE''s traditional Transactions or Journals, reviews are "binary", in that reviewers will either Accept or Reject an article in the form it is submitted in order to achieve rapid turnaround. Especially encouraged are submissions on: Multidisciplinary topics, or applications-oriented articles and negative results that do not fit within the scope of IEEE''s traditional journals. Practical articles discussing new experiments or measurement techniques, interesting solutions to engineering. Development of new or improved fabrication or manufacturing techniques. Reviews or survey articles of new or evolving fields oriented to assist others in understanding the new area.
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