Evaluating the Effects of Different Layer Multiconnectivity on Reliable Multihop Industrial WSNs

IF 8.9 1区 计算机科学 Q1 COMPUTER SCIENCE, INFORMATION SYSTEMS
Jan Schlichter;Maximilian Schwarz;Lars Wolf
{"title":"Evaluating the Effects of Different Layer Multiconnectivity on Reliable Multihop Industrial WSNs","authors":"Jan Schlichter;Maximilian Schwarz;Lars Wolf","doi":"10.1109/JIOT.2025.3549254","DOIUrl":null,"url":null,"abstract":"Increasing the reliability of multihop industrial wireless sensor networks (IWSNs) is an important challenge to enable continuous data collection in industrial processes. One approach for increasing reliability is multiconnectivity (MC), which enables simultaneous data transmission through two independent network links. In practice, MC can be implemented on all OSI layers, resulting in different parts of the network stack being duplicated. In this article, we compare the implementation of MC above the MAC layer and above the network layer, corresponding to an implementation on a per-hop basis or an end-to-end basis in multihop networks. For a comprehensive consideration, the approaches are discussed analytically, simulated and deployed in a real-world scenario to provide foundational knowledge about the effects of different layer MC on reliability. We show that the per-hop approach offers higher reliability than the end-to-end approach in homogeneous networks, while both approaches outperform the single-connectivity baseline. In comparison, the end-to-end approach outperforms the per-hop approach and the baseline depending on the network topology in heterogeneous networks. Apart from the topology and the link quality, we reveal the influence of fragmentation on both approaches. All influencing factors, in combination with external factors introduced by a real-world deployment, led to a decreased data loss rate of up to 56% compared to the single-connectivity baseline.","PeriodicalId":54347,"journal":{"name":"IEEE Internet of Things Journal","volume":"12 12","pages":"21604-21617"},"PeriodicalIF":8.9000,"publicationDate":"2025-03-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Internet of Things Journal","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10916615/","RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"COMPUTER SCIENCE, INFORMATION SYSTEMS","Score":null,"Total":0}
引用次数: 0

Abstract

Increasing the reliability of multihop industrial wireless sensor networks (IWSNs) is an important challenge to enable continuous data collection in industrial processes. One approach for increasing reliability is multiconnectivity (MC), which enables simultaneous data transmission through two independent network links. In practice, MC can be implemented on all OSI layers, resulting in different parts of the network stack being duplicated. In this article, we compare the implementation of MC above the MAC layer and above the network layer, corresponding to an implementation on a per-hop basis or an end-to-end basis in multihop networks. For a comprehensive consideration, the approaches are discussed analytically, simulated and deployed in a real-world scenario to provide foundational knowledge about the effects of different layer MC on reliability. We show that the per-hop approach offers higher reliability than the end-to-end approach in homogeneous networks, while both approaches outperform the single-connectivity baseline. In comparison, the end-to-end approach outperforms the per-hop approach and the baseline depending on the network topology in heterogeneous networks. Apart from the topology and the link quality, we reveal the influence of fragmentation on both approaches. All influencing factors, in combination with external factors introduced by a real-world deployment, led to a decreased data loss rate of up to 56% compared to the single-connectivity baseline.
评估不同层多连通性对可靠多跳工业wsn的影响
提高多跳工业无线传感器网络(IWSNs)的可靠性是实现工业过程中连续数据采集的重要挑战。提高可靠性的一种方法是多连接(MC),它允许通过两个独立的网络链路同时传输数据。实际上,MC可以在所有OSI层上实现,从而导致网络堆栈的不同部分被复制。在本文中,我们比较了MAC层之上的MC实现和网络层之上的MC实现,对应于多跳网络中基于每跳的实现或基于端到端的实现。为了全面考虑,对这些方法进行了分析、模拟和部署,以提供有关不同层MC对可靠性影响的基础知识。我们表明,在同构网络中,每跳方法比端到端方法提供更高的可靠性,而这两种方法都优于单连接基线。相比之下,端到端方法在异构网络中优于每跳方法和基线,具体取决于网络拓扑。除了拓扑结构和链路质量外,我们还揭示了碎片化对两种方法的影响。所有影响因素,再加上实际部署中引入的外部因素,导致数据损失率与单连接基线相比降低了56%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
IEEE Internet of Things Journal
IEEE Internet of Things Journal Computer Science-Information Systems
CiteScore
17.60
自引率
13.20%
发文量
1982
期刊介绍: The EEE Internet of Things (IoT) Journal publishes articles and review articles covering various aspects of IoT, including IoT system architecture, IoT enabling technologies, IoT communication and networking protocols such as network coding, and IoT services and applications. Topics encompass IoT's impacts on sensor technologies, big data management, and future internet design for applications like smart cities and smart homes. Fields of interest include IoT architecture such as things-centric, data-centric, service-oriented IoT architecture; IoT enabling technologies and systematic integration such as sensor technologies, big sensor data management, and future Internet design for IoT; IoT services, applications, and test-beds such as IoT service middleware, IoT application programming interface (API), IoT application design, and IoT trials/experiments; IoT standardization activities and technology development in different standard development organizations (SDO) such as IEEE, IETF, ITU, 3GPP, ETSI, etc.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信